The polarization and intensity of light scattered by monodisperse polystyrene latex and copper spheres, with diameters ranging from 92 to 218 nm, deposited on silicon substrates were measured with 442-, 532-, and 633-nm light. The results are compared with a theory for scattering by a sphere on a surface, originally developed by others [Physica A <b>137,</b> 209 (1986)], and extended to include coatings on the sphere and the substrate. The results show that accurate calculation of the scattering of light by a metal sphere requires that the near-field interaction between the sphere and its image be included in a complete manner. The normal-incidence approximation does not suffice for this interaction, and the existence of any thin oxide layer on the substrate must be included in the calculation.
© 2002 Optical Society of America
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(240.0240) Optics at surfaces : Optics at surfaces
(290.0290) Scattering : Scattering
(350.4990) Other areas of optics : Particles
Jung Hyeun Kim, Sheryl H. Ehrman, George W. Mulholland, and Thomas A. Germer, "Polarized Light Scattering by Dielectric and Metallic Spheres on Silicon Wafers," Appl. Opt. 41, 5405-5412 (2002)