OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 28 — Oct. 1, 2002
  • pp: 5857–5859

Long-Trace Profiler with Cyclic Optical Configuration

Sanjib Chatterjee and Y. Pawan Kumar  »View Author Affiliations


Applied Optics, Vol. 41, Issue 28, pp. 5857-5859 (2002)
http://dx.doi.org/10.1364/AO.41.005857


View Full Text Article

Acrobat PDF (61 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The results of the development of a much simpler optical configuration for the long-trace profiler (LTP) are presented. The current technique employs a cyclic optical configuration to achieve zero optical path difference for the closely spaced, laterally separated laser beams. The accuracy of measurement is found to remain as good as that in the case of the widely used LTP, although the geometrical alignment problem is simplified significantly.

© 2002 Optical Society of America

OCIS Codes
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(230.5480) Optical devices : Prisms
(340.6720) X-ray optics : Synchrotron radiation
(340.7470) X-ray optics : X-ray mirrors

Citation
Sanjib Chatterjee and Y. Pawan Kumar, "Long-Trace Profiler with Cyclic Optical Configuration," Appl. Opt. 41, 5857-5859 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-28-5857


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. A. Freund, “Mirrors for synchrotron beamlines,” in Handbook of Optics III, M. Bass, J. M. Enoch, E. W. V. Stryland, and W. L. Wolfe, eds. (McGraw-Hill, New York, 2001), pp. 26.3–26.8.
  2. P. Z. Takacs, K. Furenlid, and R. A. DeBiasse, “Surface topography measurements over the 1 meter to 10 micrometer spatial period bandwidth,” in Surface Characterization and Testing II, J. E. Greivenkamp and M. Young, eds., Proc. SPIE 1164, 203–211 (1989).
  3. S. C. Irick, “Determining surface profile from sequential interference patterns from a long trace profiler,” Rev. Sci. Instrum. 63, 1432–1435 (1992).
  4. P. Z. Takacs and S. Qian, “Metrology laboratory requirements for third-generation synchrotron radiation sources,” in Materials, Manufacturing and Measurements for Synchrotron Radiation Mirrors, P. Z. Takacs and T. W. Tonnessen, eds., Proc. SPIE 3152, 160–167 (1997).
  5. R. A. Paquin and M. R. Howells, “Mirror materials for synchrotron radiation optics,” in Materials, Manufacturing and Measurements for Synchrotron Radiation Mirrors, P. Z. Takacs and T. W. Tonnessen, eds., Proc. SPIE 3152, 2–16 (1997).
  6. P. Z. Takacs, S. Qian, and J. Colbert, “Design of a long-trace surface profiler,” in Metrology, Figure and Finish, B. E. Truax, ed., Proc. SPIE 749, 59–64 (1987).
  7. P. Z. Takacs, S.-C. K. Feng, E. L. Church, S. Qian, and W.-M. Liu, “Long trace profile measurement on cylindrical aspheres,” in Advances in Fabrication and Metrology for Optics and Large Optics, J. B. Arnold and R. E. Parks, eds., Proc. SPIE 966, 354–364 (1988).
  8. K. Von Bieren, “Pencil beam interferometer for aspherical optical surfaces,” in Laser Diagnostics, S. Holly, ed., Proc. SPIE 343, 101–108 (1982).
  9. S. Qian, W. Jark, and P. Z. Takacs, “The penta-prism LTP: a long-trace-profiler with stationary optical head and moving penta-prism,” Rev. Sci. Instrum. 36, 2562–2569 (1995).
  10. S. Qian, P. Z. Takacs, G. Sostero, and D. Cocco, “Portable long trace profiler: concept and solution,” Rev. Sci. Instrum. 72, 3198–3204 (2001).
  11. S. Qian, G. Sostero, and P. Z. Takacs, “Precision calibration and systematic error reduction in the long trace profiler,” Opt. Eng. 39, 304–310 (2000).
  12. P. Z. Takacs, E. L. Church, C. J. Bresloff, and L. Assoufid, “Improvements in the accuracy and the repeatability of long trace profiler measurements,” Appl. Opt. 38, 5468–5479 (1999).
  13. S. Qian, W. Jark, G. Sostero, A. Gambitta, F. Mazzolini, and A. Savoia, “Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a penta prism long trace profiler,” Appl. Opt. 36, 3769–3775 (1997).
  14. H. Li, P. Z. Takacs, and T. Oversluizen, “Vertical scanning long trace profiler: a tool for metrology of x-ray mirrors,” in Materials, Manufacturing and Measurements for Synchrotron Radiation Mirrors, P. Z. Takacs and T. W. Tonnessen, eds., Proc. SPIE 3152, 180–187 (1997).
  15. H. Li, X. Li, M. W. Grindel, and P. Z. Takacs, “Measurement of x-ray telescope mirrors using a vertical scanning long trace profiler,” Opt. Eng. 35, 330–338 (1996).
  16. M. V. R. K. Murty, “Lateral shearing interferometers,” in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 105–148.
  17. W. J. Smith, “Prisms and mirrors,” in Modern Optical Engineering, (McGraw-Hill, New York, 1991), p. 97.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited