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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 28 — Oct. 1, 2002
  • pp: 5857–5859

Long-trace profiler with cyclic optical configuration

Sanjib Chatterjee and Y. Pawan Kumar  »View Author Affiliations


Applied Optics, Vol. 41, Issue 28, pp. 5857-5859 (2002)
http://dx.doi.org/10.1364/AO.41.005857


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Abstract

The results of the development of a much simpler optical configuration for the long-trace profiler (LTP) are presented. The current technique employs a cyclic optical configuration to achieve zero optical path difference for the closely spaced, laterally separated laser beams. The accuracy of measurement is found to remain as good as that in the case of the widely used LTP, although the geometrical alignment problem is simplified significantly.

© 2002 Optical Society of America

OCIS Codes
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(230.5480) Optical devices : Prisms
(340.6720) X-ray optics : Synchrotron radiation
(340.7470) X-ray optics : X-ray mirrors

History
Original Manuscript: June 3, 2002
Published: October 1, 2002

Citation
Sanjib Chatterjee and Y. Pawan Kumar, "Long-trace profiler with cyclic optical configuration," Appl. Opt. 41, 5857-5859 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-28-5857

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