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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 28 — Oct. 1, 2002
  • pp: 5891–5895

Comparative study with double-exposure digital holographic interferometry and a Shack–Hartmann sensor to characterize transparent materials

Robert B. Owen and Alex A. Zozulya  »View Author Affiliations


Applied Optics, Vol. 41, Issue 28, pp. 5891-5895 (2002)
http://dx.doi.org/10.1364/AO.41.005891


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Abstract

We compare wave-front measurements using double-exposure digital holography and a Shack-Hartmann sensor. A voltage-driven liquid-crystal wedge modulates the optical wave front and provides a refractive-index gradient typical of interesting transparent materials. Measurement accuracy and reliability are similar for both methods. In our opinion, digital holographic interferometry has several advantages for both laboratory and field environments. When compared with Shack-Hartmann methods, these advantages include hardware simplicity and robustness, relative insensitivity to sample dynamic range, and less computational demanding and more straightforward data evaluation algorithms. We believe that digital holography provides the methodology of choice for field studies of transparent materials such as microgravity protein crystal growth experiments.

© 2002 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(090.2880) Holography : Holographic interferometry
(100.2000) Image processing : Digital image processing

History
Original Manuscript: April 16, 2002
Revised Manuscript: June 27, 2002
Published: October 1, 2002

Citation
Robert B. Owen and Alex A. Zozulya, "Comparative study with double-exposure digital holographic interferometry and a Shack–Hartmann sensor to characterize transparent materials," Appl. Opt. 41, 5891-5895 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-28-5891

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