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Applied Optics

Applied Optics


  • Vol. 41, Iss. 28 — Oct. 1, 2002
  • pp: 5929–5932

Improvement of the interferometric method for measuring electro-optic coefficients of poled polymer thin films

Xin Yin, Qiwei Pan, Wei Shi, and Changshui Fang  »View Author Affiliations

Applied Optics, Vol. 41, Issue 28, pp. 5929-5932 (2002)

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The interferometric method for measuring the linear electro-optic coefficients of polymer films has been improved. This improved method is based on using the antipiezoelectric effect of a quartz crystal to compensate for the change in the optical path length that is due to the electro-optic effect of a polymer film. The electro-optic coefficients of six kinds of new poled polymer film have been determined at a wavelength of 633 nm by this new method. This technique offers a simple, rapid, and highly sensitive method for measuring the electro-optic coefficients of polymer films.

© 2002 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(160.5470) Materials : Polymers
(190.0190) Nonlinear optics : Nonlinear optics
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials
(230.1980) Optical devices : Diffusers
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: March 1, 2002
Revised Manuscript: May 13, 2002
Published: October 1, 2002

Xin Yin, Qiwei Pan, Wei Shi, and Changshui Fang, "Improvement of the interferometric method for measuring electro-optic coefficients of poled polymer thin films," Appl. Opt. 41, 5929-5932 (2002)

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