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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 28 — Oct. 1, 2002
  • pp: 5929–5932

Improvement of the Interferometric Method for Measuring Electro-optic Coefficients of Poled Polymer Thin Films

Xin Yin, Qiwei Pan, Wei Shi, and Changshui Fang  »View Author Affiliations


Applied Optics, Vol. 41, Issue 28, pp. 5929-5932 (2002)
http://dx.doi.org/10.1364/AO.41.005929


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Abstract

The interferometric method for measuring the linear electro-optic coefficients of polymer films has been improved. This improved method is based on using the antipiezoelectric effect of a quartz crystal to compensate for the change in the optical path length that is due to the electro-optic effect of a polymer film. The electro-optic coefficients of six kinds of new poled polymer film have been determined at a wavelength of 633 nm by this new method. This technique offers a simple, rapid, and highly sensitive method for measuring the electro-optic coefficients of polymer films.

© 2002 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(160.5470) Materials : Polymers
(190.0190) Nonlinear optics : Nonlinear optics
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials
(230.1980) Optical devices : Diffusers
(310.6860) Thin films : Thin films, optical properties

Citation
Xin Yin, Qiwei Pan, Wei Shi, and Changshui Fang, "Improvement of the Interferometric Method for Measuring Electro-optic Coefficients of Poled Polymer Thin Films," Appl. Opt. 41, 5929-5932 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-28-5929


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References

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