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Applied Optics

Applied Optics


  • Vol. 41, Iss. 31 — Nov. 1, 2002
  • pp: 6603–6613

Limits and possibilities of laser speckle and white-light image-correlation methods: theory and experiments

Jean Brillaud and Fabienne Lagattu  »View Author Affiliations

Applied Optics, Vol. 41, Issue 31, pp. 6603-6613 (2002)

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A laser-speckle method and a white-light image-correlation method are used for strain mapping. A schematic model of the correlation function of two speckle patterns is proposed for investigation of strain influence on displacement-measurement accuracy. A specific software has been developed to calculate by direct correlation the displacement values between two pictures with a grainy pattern at any point on an object’s surface. Its efficiency is demonstrated in several tests. Moreover, theoretical results are checked through experimental measurements. The limitations and performances of both optical techniques are discussed.

© 2002 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging

Original Manuscript: March 6, 2002
Revised Manuscript: June 12, 2002
Published: November 1, 2002

Jean Brillaud and Fabienne Lagattu, "Limits and possibilities of laser speckle and white-light image-correlation methods: theory and experiments," Appl. Opt. 41, 6603-6613 (2002)

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