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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 32 — Nov. 11, 2002
  • pp: 6802–6808

Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances

Augusto Beléndez, Tarsicio Beléndez, Cristian Neipp, and Inmaculada Pascual  »View Author Affiliations


Applied Optics, Vol. 41, Issue 32, pp. 6802-6808 (2002)
http://dx.doi.org/10.1364/AO.41.006802


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Abstract

A method to determine the refractive index and thickness of silver halide emulsions used in holography is presented. The emulsions are in the form of a layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angles, and the values of refractive index, thickness, and extinction coefficient of the emulsion are obtained by using the theoretical equation for reflectance. As examples, five commercial holographic silver halide emulsions are analyzed. The procedure to obtain the measurements and the numerical analysis of the experimental data are simple, and agreement of the calculated reflectances, by use of the thickness and refractive index obtained, with the measured reflectances is satisfactory.

© 2002 Optical Society of America

OCIS Codes
(090.0090) Holography : Holography
(090.2900) Holography : Optical storage materials
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5700) Instrumentation, measurement, and metrology : Reflection
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: April 22, 2002
Revised Manuscript: August 7, 2002
Published: November 10, 2002

Citation
Augusto Beléndez, Tarsicio Beléndez, Cristian Neipp, and Inmaculada Pascual, "Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances," Appl. Opt. 41, 6802-6808 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-32-6802

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