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Applied Optics

Applied Optics


  • Vol. 41, Iss. 34 — Dec. 2, 2002
  • pp: 7309–7316

Measurements of the Refractive Index of Yttrium in the 50–1300-eV Energy Region

Benjawan Sae-Lao and Regina Soufli  »View Author Affiliations

Applied Optics, Vol. 41, Issue 34, pp. 7309-7316 (2002)

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The first experimental results to our knowledge on the refractive index ñ = 1 − δ + iβ of yttrium in the extreme-ultraviolet and soft x-ray energy ranges are discussed. To determine the absorptive part β, transmittance measurements were performed on pure yttrium films in the 50–1300-eV energy region at beamline 6.3.2 of the Advanced Light Source. The dispersive part δ was then calculated from the absorption results by means of the Kramers-Kronig transformation. Compared with prior tabulated values, the new set of data for the refractive index of yttrium is in better agreement with the sum rules and contains previously unresolved fine structure information in the regions of the M2, 3 and M4, 5 absorption edges, where yttrium-based multilayer mirrors operate.

© 2002 Optical Society of America

OCIS Codes
(040.7190) Detectors : Ultraviolet
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(230.4170) Optical devices : Multilayers
(310.6860) Thin films : Thin films, optical properties

Benjawan Sae-Lao and Regina Soufli, "Measurements of the Refractive Index of Yttrium in the 50–1300-eV Energy Region," Appl. Opt. 41, 7309-7316 (2002)

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