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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 41, Iss. 7 — Mar. 1, 2002
  • pp: 1308–1314

Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides

Junji Endo, Jun Chen, Dai Kobayashi, Yasuo Wada, and Hiroyuki Fujita  »View Author Affiliations


Applied Optics, Vol. 41, Issue 7, pp. 1308-1314 (2002)
http://dx.doi.org/10.1364/AO.41.001308


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Abstract

A type of a transmission phase-shifting laser microscope, believed to be new, has been developed. In this microscope a biprism located between a magnifying lens and an observation plane was used as a beam splitter. The biprism is laterally translated to introduce phase shifts required for quantitative phase measurement with a phase-shifting technique. The disturbance caused by a Fresnel-diffracted wave from the splitting edge of the biprism is reduced by placement of a linear beam stopper at the center of an intermediate image plane. As the first application, the developed microscope is used to measure a refractive-index distribution in optical waveguides. A difference of refractive indices of less than 6 × 10-5 is clearly measured in the submicrometer region.

© 2002 Optical Society of America

OCIS Codes
(000.2170) General : Equipment and techniques
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.7000) Instrumentation, measurement, and metrology : Transmission
(180.3170) Microscopy : Interference microscopy
(230.7370) Optical devices : Waveguides

History
Original Manuscript: April 23, 2001
Revised Manuscript: October 29, 2001
Published: March 1, 2002

Citation
Junji Endo, Jun Chen, Dai Kobayashi, Yasuo Wada, and Hiroyuki Fujita, "Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides," Appl. Opt. 41, 1308-1314 (2002)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-41-7-1308

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