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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 1 — Jan. 1, 2003
  • pp: 71–90

Analytical modeling of the white-light fringe

Slava G. Turyshev  »View Author Affiliations


Applied Optics, Vol. 42, Issue 1, pp. 71-90 (2003)
http://dx.doi.org/10.1364/AO.42.000071


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Abstract

An analytical technique for extracting phase, visibility, and amplitude information as needed for interferometric astrometry for the Space Interferometry Mission (SIM) is presented. This model accounts for a number of physical and instrumental effects and is valid for the general case of a bandpass filter. I was able to obtain a general solution for polychromatic phasors and to address the properties of unbiased fringe estimators in the presence of noise. For demonstration purposes I studied a rectangular bandpass filter with two different methods of optical path difference (OPD) modulation: stepping and ramping OPD modulation. A number of areas for further studies relevant to instrument design and simulations are outlined and discussed.

© 2003 Optical Society of America

OCIS Codes
(120.2440) Instrumentation, measurement, and metrology : Filters
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation

History
Original Manuscript: June 5, 2002
Revised Manuscript: September 24, 2002
Published: January 1, 2003

Citation
Slava G. Turyshev, "Analytical modeling of the white-light fringe," Appl. Opt. 42, 71-90 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-1-71

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