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Applied Optics

Applied Optics


  • Vol. 42, Iss. 10 — Apr. 1, 2003
  • pp: 1788–1797

Spectral-reflectance reconstruction in the near-infrared region by use of conventional charge-coupled-device camera measurements

Meritxell Vilaseca, Jaume Pujol, and Montserrat Arjona  »View Author Affiliations

Applied Optics, Vol. 42, Issue 10, pp. 1788-1797 (2003)

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Our aim is to develop a method for obtaining the reflectance spectra of samples in the near-infrared (NIR) region (800–1000 nm) by using a small number of measurements performed with a conventional CCD camera (multispectral imaging). We experimentally determined the spectral sensitivity of the CCD camera in the NIR range, used a method based on principal component analysis to reconstruct the spectral reflectance of the samples, and analyzed the number and shape of the filters that need to be used to apply this method. Finally we obtained the reflectance spectra of a set of 30 spectral curves by numerical simulation. The small amount of errors in the spectral reconstruction shows the potential of this method for reconstructing spectral reflectances in the NIR range.

© 2003 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(110.3080) Imaging systems : Infrared imaging
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(150.3040) Machine vision : Industrial inspection

Original Manuscript: April 26, 2002
Revised Manuscript: October 15, 2002
Published: April 1, 2003

Meritxell Vilaseca, Jaume Pujol, and Montserrat Arjona, "Spectral-reflectance reconstruction in the near-infrared region by use of conventional charge-coupled-device camera measurements," Appl. Opt. 42, 1788-1797 (2003)

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