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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 11 — Apr. 10, 2003
  • pp: 1958–1972

Measuring of a three-dimensional surface by use of a spatial distance computation

Yung-Sheng Chen and Bor-Tow Chen  »View Author Affiliations


Applied Optics, Vol. 42, Issue 11, pp. 1958-1972 (2003)
http://dx.doi.org/10.1364/AO.42.001958


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Abstract

The correspondence problem of two captured images, which are obtained by projecting a structured light on the measuring surface, are explored for when three-dimensional information of a given surface is needed. In our system the constraint that codifies the pattern projected on the surface has been simplified by using a random speckle pattern, thus the correspondence problem is reduced to local matching between two captured images and solved by a spatial distance computation technique. The performance of our approach, which includes a disparity error analysis, a search range suggestion, and a disparity gradient limit, are investigated and discussed. Some parameters, such as percentile constraint, sampling interval, and subpixel compensation proper for use in this approach are suggested. Experiments have shown the feasibility of the proposed method.

© 2003 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(100.6890) Image processing : Three-dimensional image processing
(110.6880) Imaging systems : Three-dimensional image acquisition

History
Original Manuscript: August 11, 2002
Revised Manuscript: December 10, 2002
Published: April 10, 2003

Citation
Yung-Sheng Chen and Bor-Tow Chen, "Measuring of a three-dimensional surface by use of a spatial distance computation," Appl. Opt. 42, 1958-1972 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-11-1958


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