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Applied Optics

Applied Optics


  • Vol. 42, Iss. 12 — Apr. 20, 2003
  • pp: 2132–2139

Size-correlated spectroscopy and imaging of rare-earth-doped nanocrystals

Adosh Mehta, Thomas Thundat, Michael D. Barnes, Vishal Chhabra, Ramesh Bhargava, Andrew P. Bartko, and Robert M. Dickson  »View Author Affiliations

Applied Optics, Vol. 42, Issue 12, pp. 2132-2139 (2003)

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Isolated europium-doped metal-oxide nanoparticles were probed by size-correlated high-numerical-aperture (far-field) imaging techniques. A modified Digital Instruments Bioscope atomic force microscope mounted upon a Nikon TE300 inverted microscope was used to interrogate (dry) particles ranging in size from 2 to 150 nm on the surface of a glass or quartz coverslip. These experiments revealed several interesting features of doped-nanoparticle luminescence such as Poissonian occupation statistics, size-dependent luminescence efficiency enhancement for particle sizes of <10 nm, and correlation of interesting transient behavior at particle sizes of <5 nm.

© 2003 Optical Society of America

OCIS Codes
(160.2540) Materials : Fluorescent and luminescent materials
(160.5690) Materials : Rare-earth-doped materials
(180.2520) Microscopy : Fluorescence microscopy
(180.5810) Microscopy : Scanning microscopy

Original Manuscript: May 21, 2002
Published: April 20, 2003

Adosh Mehta, Thomas Thundat, Michael D. Barnes, Vishal Chhabra, Ramesh Bhargava, Andrew P. Bartko, and Robert M. Dickson, "Size-correlated spectroscopy and imaging of rare-earth-doped nanocrystals," Appl. Opt. 42, 2132-2139 (2003)

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