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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 12 — Apr. 20, 2003
  • pp: 2219–2225

Variational analysis of z scan of thick medium with an elliptic Gaussian beam

Wei-Ping Zang, Jian-Guo Tian, Zhi-Bo Liu, Wen-Yuan Zhou, Chun-Ping Zhang, and Guang-Yin Zhang  »View Author Affiliations


Applied Optics, Vol. 42, Issue 12, pp. 2219-2225 (2003)
http://dx.doi.org/10.1364/AO.42.002219


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Abstract

By variational approach, we analyze the characteristics of beam propagation through a cubic optical nonlinear medium using a laser beam that has a transverse elliptic Gaussian profile. The analytic solution to the normalized transmittance at the center of the far field as a function of medium position and the beam characteristics is obtained and compared with the numerical simulation, which is realized by a combination of algorithms. We also analyze the peak-valley transmittance difference as a function of medium length, ellipticity, and astigmatism. The relationship between peak-valley normalized transmittance difference of the z-scan trace and aperture size or the slit width are obtained. Meanwhile, the comparison of z-scan characteristics with an elliptic Gaussian beam with those using a circular symmetric Gaussian beam is made.

© 2003 Optical Society of America

OCIS Codes
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(190.3270) Nonlinear optics : Kerr effect
(190.5530) Nonlinear optics : Pulse propagation and temporal solitons
(190.5940) Nonlinear optics : Self-action effects

History
Original Manuscript: May 31, 2002
Revised Manuscript: November 25, 2002
Published: April 20, 2003

Citation
Wei-Ping Zang, Jian-Guo Tian, Zhi-Bo Liu, Wen-Yuan Zhou, Chun-Ping Zhang, and Guang-Yin Zhang, "Variational analysis of z scan of thick medium with an elliptic Gaussian beam," Appl. Opt. 42, 2219-2225 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-12-2219

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