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Applied Optics

Applied Optics


  • Vol. 42, Iss. 13 — May. 1, 2003
  • pp: 2251–2256

Chemical method to increase extreme ultraviolet microchannel-plate quantum efficiency. II. Analysis and optimization

Richelieu Hemphill and Jerry Edelstein  »View Author Affiliations

Applied Optics, Vol. 42, Issue 13, pp. 2251-2256 (2003)

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Enhancement of the extreme ultraviolet quantum detection efficiency (QDE) of microchannel plate (MCP) detectors by use of a wet chemical method is examined. It is shown that the chemical process of ion exchange, in addition to physical processes that increase surface roughness and decrease surface density, augments the secondary electron emission coefficient, which in turn increases the quantum detection efficiency of the input MCP. The method has been demonstrated with nitric acid, acetic acid, or water used as the active reactant. By monitoring and optimizing the ion-exchange process, we achieved a 2.6–4.4 increase in the MCP QDE from 1216 to 304 Å, respectively, with an absolute QDE of approximately 50% at 304 Å.

© 2003 Optical Society of America

OCIS Codes
(040.3780) Detectors : Low light level
(040.5250) Detectors : Photomultipliers
(040.7190) Detectors : Ultraviolet
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(160.2750) Materials : Glass and other amorphous materials
(160.6030) Materials : Silica

Original Manuscript: August 16, 2002
Revised Manuscript: January 6, 2003
Published: May 1, 2003

Richelieu Hemphill and Jerry Edelstein, "Chemical method to increase extreme ultraviolet microchannel-plate quantum efficiency. II. Analysis and optimization," Appl. Opt. 42, 2251-2256 (2003)

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