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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 13 — May. 1, 2003
  • pp: 2289–2300

Noise-equivalent change in radiance for sampling noise in a double-sided interferogram

Douglas L. Cohen  »View Author Affiliations


Applied Optics, Vol. 42, Issue 13, pp. 2289-2300 (2003)
http://dx.doi.org/10.1364/AO.42.002289


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Abstract

The formula for the noise-equivalent change in radiance (NEdN) for sampling noise [Appl. Opt. 38, 139 (1999)] can work well when applied to the double-sided interferograms of radiance spectra dominated by isolated emission lines, but it does not work well when applied to broad, slowly varying radiance spectra such as a Planck blackbody curve. The modified formula for the sampling-noise NEdN works well when applied to the double-sided interferograms of both types of radiance spectra.

© 2003 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(070.4790) Fourier optics and signal processing : Spectrum analysis
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms
(300.6340) Spectroscopy : Spectroscopy, infrared

History
Original Manuscript: August 6, 2002
Revised Manuscript: January 9, 2003
Published: May 1, 2003

Citation
Douglas L. Cohen, "Noise-equivalent change in radiance for sampling noise in a double-sided interferogram," Appl. Opt. 42, 2289-2300 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-13-2289

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