## Analysis of Illumination Coherence Properties in Small-Source Systems Such as Synchrotrons

Applied Optics, Vol. 42, Issue 14, pp. 2506-2512 (2003)

http://dx.doi.org/10.1364/AO.42.002506

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### Abstract

Modern synchrotron beamlines often take the form of critical illumination systems, where an incoherent source of limited spatial extent is re-imaged to an experimental plane of interest. Unique constraints of synchrotron sources and beamlines, however, may preclude the use of the simple Zernike approximation for calculating the object-image coherence relationship. Here, we perform a rigorous analysis of the object-image coherence relationship valid for synchrotron beamlines. The analysis shows that beamline aberrations have an effect on the coherence properties. Effects of various low-order aberrations on the coherence properties are explicitly studied.

© 2003 Optical Society of America

**OCIS Codes**

(030.0030) Coherence and statistical optics : Coherence and statistical optics

(110.0110) Imaging systems : Imaging systems

(110.4980) Imaging systems : Partial coherence in imaging

(110.7440) Imaging systems : X-ray imaging

**Citation**

Chang Chang, Patrick Naulleau, and David Attwood, "Analysis of Illumination Coherence Properties in Small-Source Systems Such as Synchrotrons," Appl. Opt. **42**, 2506-2512 (2003)

http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-14-2506

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