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Applied Optics

Applied Optics


  • Vol. 42, Iss. 14 — May. 10, 2003
  • pp: 2506–2512

Analysis of Illumination Coherence Properties in Small-Source Systems Such as Synchrotrons

Chang Chang, Patrick Naulleau, and David Attwood  »View Author Affiliations

Applied Optics, Vol. 42, Issue 14, pp. 2506-2512 (2003)

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Modern synchrotron beamlines often take the form of critical illumination systems, where an incoherent source of limited spatial extent is re-imaged to an experimental plane of interest. Unique constraints of synchrotron sources and beamlines, however, may preclude the use of the simple Zernike approximation for calculating the object-image coherence relationship. Here, we perform a rigorous analysis of the object-image coherence relationship valid for synchrotron beamlines. The analysis shows that beamline aberrations have an effect on the coherence properties. Effects of various low-order aberrations on the coherence properties are explicitly studied.

© 2003 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(110.0110) Imaging systems : Imaging systems
(110.4980) Imaging systems : Partial coherence in imaging
(110.7440) Imaging systems : X-ray imaging

Chang Chang, Patrick Naulleau, and David Attwood, "Analysis of Illumination Coherence Properties in Small-Source Systems Such as Synchrotrons," Appl. Opt. 42, 2506-2512 (2003)

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