Modern synchrotron beamlines often take the form of critical illumination systems, where an incoherent source of limited spatial extent is re-imaged to an experimental plane of interest. Unique constraints of synchrotron sources and beamlines, however, may preclude the use of the simple Zernike approximation for calculating the object-image coherence relationship. Here, we perform a rigorous analysis of the object-image coherence relationship valid for synchrotron beamlines. The analysis shows that beamline aberrations have an effect on the coherence properties. Effects of various low-order aberrations on the coherence properties are explicitly studied.
© 2003 Optical Society of America
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(110.0110) Imaging systems : Imaging systems
(110.4980) Imaging systems : Partial coherence in imaging
(110.7440) Imaging systems : X-ray imaging
Chang Chang, Patrick Naulleau, and David Attwood, "Analysis of Illumination Coherence Properties in Small-Source Systems Such as Synchrotrons," Appl. Opt. 42, 2506-2512 (2003)