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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 14 — May. 10, 2003
  • pp: 2506–2512

Analysis of illumination coherence properties in small-source systems such as synchrotrons

Chang Chang, Patrick Naulleau, and David Attwood  »View Author Affiliations


Applied Optics, Vol. 42, Issue 14, pp. 2506-2512 (2003)
http://dx.doi.org/10.1364/AO.42.002506


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Abstract

Modern synchrotron beamlines often take the form of critical illumination systems, where an incoherent source of limited spatial extent is re-imaged to an experimental plane of interest. Unique constraints of synchrotron sources and beamlines, however, may preclude the use of the simple Zernike approximation for calculating the object-image coherence relationship. Here, we perform a rigorous analysis of the object-image coherence relationship valid for synchrotron beamlines. The analysis shows that beamline aberrations have an effect on the coherence properties. Effects of various low-order aberrations on the coherence properties are explicitly studied.

© 2003 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(110.0110) Imaging systems : Imaging systems
(110.4980) Imaging systems : Partial coherence in imaging
(110.7440) Imaging systems : X-ray imaging

History
Original Manuscript: September 20, 2002
Revised Manuscript: December 11, 2002
Published: May 10, 2003

Citation
Chang Chang, Patrick Naulleau, and David Attwood, "Analysis of illumination coherence properties in small-source systems such as synchrotrons," Appl. Opt. 42, 2506-2512 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-14-2506


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