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Applied Optics

Applied Optics


  • Vol. 42, Iss. 14 — May. 10, 2003
  • pp: 2526–2531

Laser excess noise reduction in optical phase-shift measurements

Oleg Mitrofanov  »View Author Affiliations

Applied Optics, Vol. 42, Issue 14, pp. 2526-2531 (2003)

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We describe an optical detection scheme that reduces laser excess noise in measurements of small optical phase shifts. The scheme improves the sensitivity of the balanced differential detection. Analysis of the scheme and comparison with the conventional detection are presented. The scheme is applied in electro-optic probing of electrical signals in integrated circuits, where the excess laser noise is reduced by ∼20 dB.

© 2003 Optical Society of America

OCIS Codes
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.2920) Instrumentation, measurement, and metrology : Homodyning
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.1440) Physical optics : Birefringence
(260.2130) Physical optics : Ellipsometry and polarimetry
(320.7100) Ultrafast optics : Ultrafast measurements

Original Manuscript: October 17, 2002
Revised Manuscript: December 2, 2002
Published: May 10, 2003

Oleg Mitrofanov, "Laser excess noise reduction in optical phase-shift measurements," Appl. Opt. 42, 2526-2531 (2003)

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  10. Reflection-mode probing without the beam splitter is realized in Ref. 2. It has the same depth of modulation as scheme A, and it avoids the reflection loss of 4%.

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Fig. 1 Fig. 2

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