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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 14 — May. 10, 2003
  • pp: 2526–2531

Laser excess noise reduction in optical phase-shift measurements

Oleg Mitrofanov  »View Author Affiliations


Applied Optics, Vol. 42, Issue 14, pp. 2526-2531 (2003)
http://dx.doi.org/10.1364/AO.42.002526


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Abstract

We describe an optical detection scheme that reduces laser excess noise in measurements of small optical phase shifts. The scheme improves the sensitivity of the balanced differential detection. Analysis of the scheme and comparison with the conventional detection are presented. The scheme is applied in electro-optic probing of electrical signals in integrated circuits, where the excess laser noise is reduced by ∼20 dB.

© 2003 Optical Society of America

OCIS Codes
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.2920) Instrumentation, measurement, and metrology : Homodyning
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.1440) Physical optics : Birefringence
(260.2130) Physical optics : Ellipsometry and polarimetry
(320.7100) Ultrafast optics : Ultrafast measurements

History
Original Manuscript: October 17, 2002
Revised Manuscript: December 2, 2002
Published: May 10, 2003

Citation
Oleg Mitrofanov, "Laser excess noise reduction in optical phase-shift measurements," Appl. Opt. 42, 2526-2531 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-14-2526

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