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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 16 — Jun. 1, 2003
  • pp: 3268–3270

Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films

Marcelo B. Pereira and Flavio Horowitz  »View Author Affiliations


Applied Optics, Vol. 42, Issue 16, pp. 3268-3270 (2003)
http://dx.doi.org/10.1364/AO.42.003268


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Abstract

In the standard M-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which is applicable to existing samples and does not require masking before ion exchange.

© 2003 Optical Society of America

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: August 6, 2002
Revised Manuscript: February 13, 2003
Published: June 1, 2003

Citation
Marcelo B. Pereira and Flavio Horowitz, "Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films," Appl. Opt. 42, 3268-3270 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-16-3268

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