OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 42, Iss. 16 — Jun. 1, 2003
  • pp: 3268–3270

Simple Polarimetric Approach to Direct Measurement of the Near-Surface Refractive Index in Graded-Index Films

Marcelo B. Pereira and Flavio Horowitz  »View Author Affiliations

Applied Optics, Vol. 42, Issue 16, pp. 3268-3270 (2003)

View Full Text Article

Acrobat PDF (79 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



In the standard M-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which is applicable to existing samples and does not require masking before ion exchange.

© 2003 Optical Society of America

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(310.6860) Thin films : Thin films, optical properties

Marcelo B. Pereira and Flavio Horowitz, "Simple Polarimetric Approach to Direct Measurement of the Near-Surface Refractive Index in Graded-Index Films," Appl. Opt. 42, 3268-3270 (2003)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. P. K. Tien, R. Ulrich, and R. J. Martin, “Modes of propagating light waves in thin deposited semiconductor films,” Appl. Phys. Lett. 14, 291–294 (1969).
  2. S. Pelli, G. C. Righini, A. Scaglione, G.-L. Yip, P. Noutsious, A. Bräuer, P. Dannberg, J. Liñares, C. Gomez Reino, G. Mazzi, F. Gonella, R. Rimet, and I. Schanen, “Testing of Optical waveguides (TOW) cooperative project: preliminary results of the characterization of k-exchanged waveguides,” in Linear and Nonlinear Integrated Optics, G. C. Righini and D. Yevick, eds., Proc. SPIE 2212, 126–131 (1994).
  3. M. B. Pereira and F. Horowitz, “Optical surface analysis of graded index coatings on glass,” J. Non-Cryst. Solids 218, 286–290 (1997).
  4. F. Horowitz, M. B. Pereira, and M. Behar, “Analysis of Ag+-exchanged glass coatings in the near-surface region,” Opt. Commun. 182, 129–133 (2000).
  5. F. Horowitz, M. B. Pereira, M. Behar, S. Pelli, and G. C. Righini, “Characterization of the near-surface region in ion-exchange glass waveguides,” in Optoelectronic Materials and Devices: Integrated Optics Devices V, G. C. Righini and S. Honkanen, eds., Proc. SPIE 4277, 99–104 (2001).
  6. F. Abelès, “Recherches sur la propagation des ondes électromagnétiques sinusoidales dans les milieux stratifiés. Application aux couches minces,” Ph.D. dissertation (Université de Paris Faculté des Sciences, Paris, 1949), pp. 1–120.
  7. M. J. Hacskaylo, “Determination of the refractive index of thin dielectric films,” J. Opt. Soc. Am. 54, 198–203 (1964).
  8. S. Hacke, “Brewsterwinkel-Mikroskopie zur Untersuchung der Kristallisation von Calciumcarbonaten an Modell-Monofilmen an der Grenzfläche Wasser/Luft,” Ph.D. thesis (Georg-August-Universität zu Göttingen, Göttingen, Germany, 2001), pp. 1–59.
  9. H. E. Bennett and J. M. Bennett, “Precision measurements in thin film optics,” in Physics of Thin Films, Advances in Research and Development, G. Hass and R. E. Thun, eds. (Academic, New York, 1967), Vol. 4, pp. 1–90.
  10. M. B. Pereira, “Optical metrology of surfaces and dielectric films, with extension to inhomogeneous coating microstructures,” M.Sc. dissertation (Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil, 1998; in Portuguese), pp. 1–97.
  11. T. G. Giallorenzi, E. J. West, R. Kirk, R. Ginhter, and R. A. Andrews, “Optical waveguides formed by thermal migration of ions in glass,” Appl. Opt. 12, 1240–1245 (1973).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited