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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 18 — Jun. 20, 2003
  • pp: 3558–3563

Optical approach for determining strain anisotropy in quantum wells

Mark L. Biermann, James Diaz-Barriga, and William S. Rabinovich  »View Author Affiliations


Applied Optics, Vol. 42, Issue 18, pp. 3558-3563 (2003)
http://dx.doi.org/10.1364/AO.42.003558


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Abstract

Anisotropic in-plane strain arises in quantum-well systems by design or unintentionally. We propose two methods of measuring the in-plane strain anisotropy based on the optical polarization anisotropy that arises with anisotropic in-plane strain. One method uses purely optical means to determine the strain anisotropy in quantum wells under a compressive strain that is spatially varying. A second approach, applicable to quantum wells under tensile strain or with strain that does not vary with position, requires the application of a uniaxial in-plane stress. Although the second method is experimentally more difficult, it allows analysis of systems that would otherwise be inaccessible.

© 2003 Optical Society of America

OCIS Codes
(130.5990) Integrated optics : Semiconductors
(160.2100) Materials : Electro-optical materials
(160.6000) Materials : Semiconductor materials
(300.6470) Spectroscopy : Spectroscopy, semiconductors

History
Original Manuscript: November 4, 2002
Revised Manuscript: March 7, 2003
Published: June 20, 2003

Citation
Mark L. Biermann, James Diaz-Barriga, and William S. Rabinovich, "Optical approach for determining strain anisotropy in quantum wells," Appl. Opt. 42, 3558-3563 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-18-3558

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