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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3756–3764

Imaging multispectral polarimetric sensor: single-pixel design, fabrication, and characterization

Donghyun Kim, Cardinal Warde, Kenneth Vaccaro, and Charles Woods  »View Author Affiliations


Applied Optics, Vol. 42, Issue 19, pp. 3756-3764 (2003)
http://dx.doi.org/10.1364/AO.42.003756


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Abstract

A discrete-component approach was taken to establish the operational feasibility of a novel, imaging, midinfrared, multispectral, polarimetric sensor for remote-sensing application. The sensor is designed to exploit the spectral and polarimetric characteristics of the scene as discriminants. Pixelated multispectral filters and polarization filters were designed and fabricated on sapphire and Si substrates, respectively, and both were characterized. A single-pixel spectropolarimetric composite filter was characterized by use of a Fourier transform infrared spectrometer and a Pt-Si thermal-imaging camera. The experimental results show excellent agreement with theoretical predictions.

© 2003 Optical Society of America

OCIS Codes
(120.2440) Instrumentation, measurement, and metrology : Filters
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.5440) Optical devices : Polarization-selective devices
(310.0310) Thin films : Thin films

History
Original Manuscript: November 1, 2002
Revised Manuscript: March 6, 2003
Published: July 1, 2003

Citation
Donghyun Kim, Cardinal Warde, Kenneth Vaccaro, and Charles Woods, "Imaging multispectral polarimetric sensor: single-pixel design, fabrication, and characterization," Appl. Opt. 42, 3756-3764 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-3756


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