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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3800–3810

Full-field birefringence imaging by thermal-light polarization-sensitive optical coherence tomography. I. Theory

Julien Moreau, Vincent Loriette, and Albert-Claude Boccara  »View Author Affiliations


Applied Optics, Vol. 42, Issue 19, pp. 3800-3810 (2003)
http://dx.doi.org/10.1364/AO.42.003800


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Abstract

A method for measuring birefringence by use of thermal-light polarization-sensitive optical coherence tomography is presented. The use of thermal light brings to polarization-sensitive optical coherence tomography a resolution in the micrometer range in three dimensions. The instrument is based on a Linnik interference microscope and makes use of achromatic quarter-wave plates. A mathematical representation of the instrument is presented here, and the detection scheme is described, together with a discussion of the validity domain of the equations used to evaluate the birefringence in the presence of white-light illumination.

© 2003 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(260.1440) Physical optics : Birefringence

History
Original Manuscript: September 13, 2002
Revised Manuscript: January 28, 2003
Published: July 1, 2003

Citation
Julien Moreau, Vincent Loriette, and Albert-Claude Boccara, "Full-field birefringence imaging by thermal-light polarization-sensitive optical coherence tomography. I. Theory," Appl. Opt. 42, 3800-3810 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-3800

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