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Applied Optics

Applied Optics


  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3832–3842

Monte Carlo modeling of an integrating sphere reflectometer

Alexander V. Prokhorov, Sergey N. Mekhontsev, and Leonard M. Hanssen  »View Author Affiliations

Applied Optics, Vol. 42, Issue 19, pp. 3832-3842 (2003)

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The Monte Carlo method has been applied to numerical modeling of an integrating sphere designed for hemispherical-directional reflectance factor measurements. It is shown that a conventional algorithm of backward ray tracing used for estimation of characteristics of the radiation field at a given point has slow convergence for small source-to-sphere-diameter ratios. A newly developed algorithm that substantially improves the convergence by calculation of direct source-induced irradiation for every point of diffuse reflection of rays traced is described. The method developed is applied to an integrating sphere reflectometer for the visible and infrared spectral ranges. Parametric studies of hemispherical radiance distributions for radiation incident onto the sample center were performed. The deviations of measured sample reflectance from the actual reflectance as a result of various factors were computed. The accuracy of the results, adequacy of the reflectance model, and other important aspects of the algorithm implementation are discussed.

© 2003 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(000.5490) General : Probability theory, stochastic processes, and statistics
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3150) Instrumentation, measurement, and metrology : Integrating spheres
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5700) Instrumentation, measurement, and metrology : Reflection

Original Manuscript: July 25, 2002
Revised Manuscript: January 14, 2003
Published: July 1, 2003

Alexander V. Prokhorov, Sergey N. Mekhontsev, and Leonard M. Hanssen, "Monte Carlo modeling of an integrating sphere reflectometer," Appl. Opt. 42, 3832-3842 (2003)

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