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Applied Optics

Applied Optics


  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3910–3914

Direct measurement of refractive-index dispersion of transparent media by white-light interferometry

Matteo Galli, Franco Marabelli, and Giorgio Guizzetti  »View Author Affiliations

Applied Optics, Vol. 42, Issue 19, pp. 3910-3914 (2003)

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We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 μm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(λ) over the whole investigated spectral range is thus obtained directly to an accuracy of 10-4 without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.

© 2003 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.2030) Physical optics : Dispersion

Original Manuscript: December 23, 2002
Revised Manuscript: March 26, 2003
Published: July 1, 2003

Matteo Galli, Franco Marabelli, and Giorgio Guizzetti, "Direct measurement of refractive-index dispersion of transparent media by white-light interferometry," Appl. Opt. 42, 3910-3914 (2003)

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  1. C. Sainz, P. Jourdain, R. Escalona, J. Calatrani, “Real time interferometric measurements of dispersion curves,” Opt. Commun. 110, 381–390 (1994). [CrossRef]
  2. H. Delbarre, C. Przygodzki, M. Tassou, D. Boucher, “High-precision index measurement in anisotropic crystals using white-light spectral interferometry,” Appl. Phys. B 70, 45–51 (2000). [CrossRef]
  3. P. Hlubina, “White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica,” Opt. Commun. 193, 1–7 (2001). [CrossRef]
  4. W. H. Knox, N. M. Pearson, K. D. Li, C. A. Hirlimann, “Interferometric measurements of femtosecond group delay in optical components,” Opt. Lett. 13, 574–576 (1988). [CrossRef] [PubMed]
  5. K. D. Li, W. H. Knox, N. M. Pearson, “Broadband cubic-phase compensation with resonant Gires-Turnois interferometers,” Opt. Lett. 14, 450–452 (1989). [CrossRef] [PubMed]
  6. M. Beck, I. A. Walmsley, “Measurement of group delay with high temporal and spectral resolution,” Opt. Lett. 15, 492–494 (1990). [CrossRef] [PubMed]
  7. K. Naganuma, K. Mogi, H. Yamada, “Group-delay measurements using the Fourier transform of an interferometric cross correlation generated by white light,” Opt. Lett 15, 393–395 (1990). [CrossRef] [PubMed]
  8. V. N. Kumar, D. N. Rao, “Using interference in the frequency domain for precise determination of thickness and refractive indices of normal dispersive materials,” J. Opt. Soc. Am. B 12, 1559–1563 (2995). [CrossRef]
  9. S. Diddams, J. C. Diels, “Dispersion measurements with white-light interferometry,” J. Opt. Soc. Am. B 13, 1120–1128 (1996).
  10. I. Abdulhalim, “Spectroscopic interference microscopy technique for measurement of layer parameters,” Meas. Sci. Technol. 12, 1996–2001 (2001). [CrossRef]
  11. K. Betzler, A. Groene, N. Schmidt, P. Voigt, “Interferometric measurements of refractive indices,” Rev. Sci. Instrum. 59, 652–653 (1988). [CrossRef]
  12. S. A. Alexandrov, I. V. Chernyh, “Interference method for determination of the refractive index and thickness,” Opt. Eng. 39, 2480–2486 (2000). [CrossRef]
  13. S. De Nicola, P. Ferraro, A. Finzio, P. De Natale, S. Grilli, G. Pierattini, “A Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals,” Opt. Commun. 202, 9–15 (2002). [CrossRef]
  14. E. D. Palik, Handbook of Optical Constants of Solids (Academic, Orlando, Fla., 1985).
  15. I. H. Malitson, “Interspecimen comparison of the refractive index of fused silica,” J. Opt. Soc. Am. 55, 1205–1209 (1965). [CrossRef]

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