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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 3950–3956

Characterization of materials for a vacuum-ultraviolet polarization analyzer

Gianni Corti and Marco Romoli  »View Author Affiliations


Applied Optics, Vol. 42, Issue 19, pp. 3950-3956 (2003)
http://dx.doi.org/10.1364/AO.42.003950


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Abstract

Astronomical measurements in the vacuum-UV spectral region (30–190 nm) require space instruments and techniques that are at the boundary between visible and x-ray techniques. In vacuum-UV polarimetry, transmission polarizers must be replaced by reflection polarizers because of the lack of transparent materials in the 30–105-nm range. The general features of a single reflection polarization analyzer for the vacuum UV are introduced and described, with particular emphasis on astrophysical applications. In particular, we discuss the trade-off conditions for optimum polarization and throughput of a single-reflection surface in the vacuum UV, introducing a quality factor parameter. The polarization performances of various reflecting materials are obtained with a reflecting vacuum-UV polarization analyzer laboratory model designed and built to measure the state of linear polarization. On the basis of a comparison of the quality factors, calcium fluoride is determined to be the best-performing material. Finally, we discuss the laboratory polarimetric characterizations of the material properties for astronomical application of the polarization analyzer.

© 2003 Optical Society of America

OCIS Codes
(040.7190) Detectors : Ultraviolet
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.4670) Materials : Optical materials
(350.1260) Other areas of optics : Astronomical optics

History
Original Manuscript: June 25, 2002
Revised Manuscript: February 3, 2003
Published: July 1, 2003

Citation
Gianni Corti and Marco Romoli, "Characterization of materials for a vacuum-ultraviolet polarization analyzer," Appl. Opt. 42, 3950-3956 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-3950

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