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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 4002–4007

Laser-scanning surface plasmon polariton resonance microscopy with multiple photodetectors

Takuo Tanaka and Sadahiko Yamamoto  »View Author Affiliations


Applied Optics, Vol. 42, Issue 19, pp. 4002-4007 (2003)
http://dx.doi.org/10.1364/AO.42.004002


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Abstract

We report the development of a laser-scanning surface plasmon resonance microscope equipped with multiple photodetectors. The system simultaneously obtains images that have different orientations to the specimen under examination, and the system can achieve a spatial resolution of 1.6 μm, which is shorter than the propagation length of the scanning surface plasmons, while high sensitivity to thickness and refractive-index distributions is retained. In addition, because the system uses a laser-scanning microscope, it can obtain high-contrast images. The measurable ranges of refractive-index distributions and thicknesses of specimens that can be measured are also discussed.

© 2003 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.5810) Microscopy : Scanning microscopy
(240.6680) Optics at surfaces : Surface plasmons

History
Original Manuscript: October 30, 2002
Revised Manuscript: April 9, 2003
Published: July 1, 2003

Citation
Takuo Tanaka and Sadahiko Yamamoto, "Laser-scanning surface plasmon polariton resonance microscopy with multiple photodetectors," Appl. Opt. 42, 4002-4007 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-4002

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