Evaluation of Bent-Crystal X-Ray Backlighting and Microscopy Techniques for the Sandia Z Machine
Applied Optics, Vol. 42, Issue 19, pp. 4059-4071 (2003)
http://dx.doi.org/10.1364/AO.42.004059
Acrobat PDF (586 KB)
Abstract
X-ray backlighting and microscopy systems for the 1–10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (≤10 μm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-μm resolution over a 20-mm field of view are presented.
© 2003 Optical Society of America
OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(340.7440) X-ray optics : X-ray imaging
(350.5400) Other areas of optics : Plasmas
Citation
Daniel B. Sinars, Guy R. Bennett, David F. Wenger, Michael E. Cuneo, and John L. Porter, "Evaluation of Bent-Crystal X-Ray Backlighting and Microscopy Techniques for the Sandia Z Machine," Appl. Opt. 42, 4059-4071 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-4059
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