X-ray backlighting and microscopy systems for the 1–10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (≤10 μm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-μm resolution over a 20-mm field of view are presented.
© 2003 Optical Society of America
Original Manuscript: July 5, 2002
Revised Manuscript: December 9, 2003
Published: July 1, 2003
Daniel B. Sinars, Guy R. Bennett, David F. Wenger, Michael E. Cuneo, and John L. Porter, "Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine," Appl. Opt. 42, 4059-4071 (2003)