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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 19 — Jul. 1, 2003
  • pp: 4059–4071

Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine

Daniel B. Sinars, Guy R. Bennett, David F. Wenger, Michael E. Cuneo, and John L. Porter  »View Author Affiliations


Applied Optics, Vol. 42, Issue 19, pp. 4059-4071 (2003)
http://dx.doi.org/10.1364/AO.42.004059


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Abstract

X-ray backlighting and microscopy systems for the 1–10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (≤10 μm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-μm resolution over a 20-mm field of view are presented.

© 2003 Optical Society of America

OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(340.7440) X-ray optics : X-ray imaging
(350.5400) Other areas of optics : Plasmas

History
Original Manuscript: July 5, 2002
Revised Manuscript: December 9, 2003
Published: July 1, 2003

Citation
Daniel B. Sinars, Guy R. Bennett, David F. Wenger, Michael E. Cuneo, and John L. Porter, "Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine," Appl. Opt. 42, 4059-4071 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-19-4059


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