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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 2 — Jan. 10, 2003
  • pp: 251–258

Optimal Re-Referencing Rate for In-Plane Dynamic Speckle Interferometry

Angelica Svanbro, Jonathan M. Huntley, and Abundio Davila  »View Author Affiliations


Applied Optics, Vol. 42, Issue 2, pp. 251-258 (2003)
http://dx.doi.org/10.1364/AO.42.000251


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Abstract

We investigate experimentally the optimal rate at which the reference speckle pattern should be updated when dynamic speckle interferometry is used to measure transient in-plane displacement fields. Images are captured with a high-speed camera and phase shifting and phase unwrapping are done temporally. For a wide range of in-plane velocities, up to a maximum of 40% of the Nyquist limit, the random errors in the calculated displacement field are minimized by updating the reference speckle pattern after a speckle displacement of 1/10 of the pixel spacing. The technique is applied to measurements of microscale deformation fields within an adhesive joint in a carbon-fiber epoxy composite.

© 2003 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Citation
Angelica Svanbro, Jonathan M. Huntley, and Abundio Davila, "Optimal Re-Referencing Rate for In-Plane Dynamic Speckle Interferometry," Appl. Opt. 42, 251-258 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-2-251

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