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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 22 — Aug. 1, 2003
  • pp: 4468–4479

Absolute Interferometric Test of Aspheres by Use of Twin Computer-Generated Holograms

Stephan Reichelt, Christof Pruss, and Hans J. Tiziani  »View Author Affiliations


Applied Optics, Vol. 42, Issue 22, pp. 4468-4479 (2003)
http://dx.doi.org/10.1364/AO.42.004468


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Abstract

A complete absolute interferometric test of axially symmetric aspheres is presented. The method is based on a specially designed computer-generated hologram (CGH) that reconstructs an aspherical wave as well as a spherical auxiliary wave. Since both phase functions have the same symmetry and their pattern is simultaneously encoded, we call this type of multiplex hologram a Twin-CGH. The spherical wave is used for calibration. The aberrations of the spherical auxiliary wave are measured absolutely with either a spherical mirror or an absolute test for Fresnel zone plates. Thus the two types of aberration inherent in the CGH can be identified and separated from each other. The errors of the spherical wave can be transferred to those of the aspherical wave. Two different methods that use Twin-CGHs for absolute testing of aspheric surfaces are described. Test procedures are explained, equations are derived, and experimental results are presented. A mutual comparison of the two results and a comparison with the established N-position rotation test are given.

© 2003 Optical Society of America

OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(220.1250) Optical design and fabrication : Aspherics

Citation
Stephan Reichelt, Christof Pruss, and Hans J. Tiziani, "Absolute Interferometric Test of Aspheres by Use of Twin Computer-Generated Holograms," Appl. Opt. 42, 4468-4479 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-22-4468

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