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Applied Optics

Applied Optics


  • Vol. 42, Iss. 22 — Aug. 1, 2003
  • pp: 4488–4498

Amplitude and phase microscopy for sizing of spherical particles

Nicolas B. E. Sawyer, Stephen P. Morgan, Michael G. Somekh, Chung W. See, Eugene Astrakharchik-Farrimond, and Boris Y. Shekunov  »View Author Affiliations

Applied Optics, Vol. 42, Issue 22, pp. 4488-4498 (2003)

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We describe a numerical vector diffraction model based on Mie theory that describes the imaging of spherical particles by bright-field, confocal, and interferometric microscopes. The model correctly scales the amplitude-scattered field relative to the incident field so that the forward-scattered and incident light can be interfered to correctly model imaging with copolarization transmission microscopes for the first time to our knowledge. The model is used to demonstrate that amplitude and phase imaging with an interferometric microscope allows subwavelength particle sizing. Furthermore, we show that the phase channel allows much smaller particles to be sized than amplitude-only measurements. The model is validated by experimental measurements.

© 2003 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.1790) Microscopy : Confocal microscopy
(180.3170) Microscopy : Interference microscopy
(290.5820) Scattering : Scattering measurements
(290.5850) Scattering : Scattering, particles

Original Manuscript: September 23, 2002
Revised Manuscript: May 8, 2003
Published: August 1, 2003

Nicolas B. E. Sawyer, Stephen P. Morgan, Michael G. Somekh, Chung W. See, Eugene Astrakharchik-Farrimond, and Boris Y. Shekunov, "Amplitude and phase microscopy for sizing of spherical particles," Appl. Opt. 42, 4488-4498 (2003)

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