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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 22 — Aug. 1, 2003
  • pp: 4549–4559

Echelle gratings acting as one

Peter Lindblom  »View Author Affiliations


Applied Optics, Vol. 42, Issue 22, pp. 4549-4559 (2003)
http://dx.doi.org/10.1364/AO.42.004549


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Abstract

A new device for producing order-sortable echelle spectra by use of consecutive diffractions in several echelle grating surfaces is described. This echelle emulating device (EED) comprises a prism placed in the path between a pair of echelle grating surfaces. The refractive angle of the prism is fixed through a simple relation. The device reproduces all the main properties of a single virtual echelle, obtained from a simple grating equation describing the combined action of the gratings and the prism. The spectral order of the EED is the sum of the spectral orders of the individual gratings. A spectrograph that utilizes the device is described, and several applications are discussed.

© 2003 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(230.1950) Optical devices : Diffraction gratings
(300.6170) Spectroscopy : Spectra

History
Original Manuscript: April 15, 2003
Published: August 1, 2003

Citation
Peter Lindblom, "Echelle gratings acting as one," Appl. Opt. 42, 4549-4559 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-22-4549


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References

  1. G. R. Harrison, “The production of diffraction gratings: the design of echelle gratings and spectrographs,” J. Opt. Soc. Am. 39, 522–528 (1949). [CrossRef]
  2. S. Engman, P. Lindblom, “Multiechelle grating mountings with high spectral resolution and dispersion,” Appl. Opt. 21, 4363–4367 (1982). [CrossRef] [PubMed]
  3. P. Lindblom, “Diffraction of light,” Swedish patent application0200627-8 (1March2002).
  4. P. Lindblom, “New compact echelle spectrographs with multichannel time-resolved recording capabilities,” Anal. Chim. Acta 380, 353–359 (1999). [CrossRef]
  5. P. Lindblom, “Apparatus for carrying out spectral analysis of an optical light source using image detection and separation of spectral orders,” U.S. patent5,859,702 (12January1999).
  6. S. Engman, P. Lindblom, “Blaze characteristics of echelle gratings,” Appl. Opt. 21, 4356–4362 (1982). [CrossRef] [PubMed]
  7. P. Lindblom, F. Stenman, “Resolving power of multigrating spectrometers,” Appl. Opt. 28, 2542–2549 (1989). [CrossRef] [PubMed]
  8. A. D. Sappey, G. Murphy, “Echelle grating dense wavelength division multiplexer/demultiplexer,” U.S. patent6,415,080 (2July2002).

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