OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 22 — Aug. 1, 2003
  • pp: 4584–4589

Characterization of Thin-Film Losses with a Synchronously Pumped Ringdown Cavity

Georgiy Vaschenko, Yogesh Godwal, Carmen S. Menoni, Claude Montcalm, Richard Blacker, and Daniel Siegfried  »View Author Affiliations


Applied Optics, Vol. 42, Issue 22, pp. 4584-4589 (2003)
http://dx.doi.org/10.1364/AO.42.004584


View Full Text Article

Acrobat PDF (120 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We describe the use of a synchronously pumped ringdown cavity for measuring total optical losses, absorption and scattering, in thin optical films of arbitrary thickness on transparent substrates. This technique is compared with a single-pulse ringdown cavity regime and is shown to have a superior signal-to-noise ratio and resolution. We also provide an analysis of the factors affecting the resolution of the technique. Using this ringdown cavity pumped by a conventional mode-locked Ti:sapphire laser, we experimentally detect losses of only 58 ± 9 and 112 ± 9 parts per million in Ta2O5 and SiO2 films, respectively. To our knowledge, these are so far the lowest losses measured in thin films on stand-alone transparent substrates.

© 2003 Optical Society of America

OCIS Codes
(300.1030) Spectroscopy : Absorption
(300.6250) Spectroscopy : Spectroscopy, condensed matter
(310.6860) Thin films : Thin films, optical properties

Citation
Georgiy Vaschenko, Yogesh Godwal, Carmen S. Menoni, Claude Montcalm, Richard Blacker, and Daniel Siegfried, "Characterization of Thin-Film Losses with a Synchronously Pumped Ringdown Cavity," Appl. Opt. 42, 4584-4589 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-22-4584


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. A. O’Keefe and D. A. G. Deacon, “Cavity ring-down optical spectrometer for absorption measurements using pulsed laser sources,” Rev. Sci. Instrum. 59, 2544–2551 (1988).
  2. D. Romanini and K. K. Lehmann, “Ring-down cavity absorption spectroscopy of the very weak HCN overtone bands with six, seven, and eight stretching quanta,” J. Chem. Phys. 99, 6287–6301 (1993).
  3. P. Zalicki and R. N. Zare, “Cavity ring-down spectroscopy for quantitative absorption measurements,” J. Chem. Phys. 102, 2708–2717 (1995).
  4. G. Rempe, R. J. Thompson, H. J. Kimble, and R. Lalezari, “Measurement of ultralow losses in an optical interferometer,” Opt. Lett. 17, 363–365 (1992).
  5. P. Roche, M. Commandré, L. Escoubas, J. P. Borgogno, G. Albrand, and B. Lazaridès, “Substrate effects on absorption of coated surfaces,” Appl. Opt. 35, 5059–5066 (1996).
  6. A. Hordvik, “Measurement techniques for small absorption coefficients: recent advances,” Appl. Opt. 16, 2827–2833 (1977).
  7. R. Lalezari, M. Kriewaldt, and D. Long, “A method for determining dielectric losses of thin films,” in Optical Interference Coatings, Vol. 15 of 1992 OSA Technical Digest Series(Optical Society of America, Washington, D.C., 1992), pp. 328–330.
  8. R. Engeln, G. von Helden, A. J. A. van Roij, and G. Meijer, “Cavity ring down spectroscopy on solid C60,” J. Chem. Phys. 110, 2732–2733 (1999).
  9. S. L. Logunov, “Cavity ringdown detection of losses in thin films in the telecommunication wavelength window,” Appl. Opt. 40, 1570–1573 (2001).
  10. E. R. Crosson, P. Haar, G. A. Marcus, H. A. Schwettman, B. A. Paldus, T. G. Spence, and R. N. Zare, “Pulse-stacked cavity ring-down spectroscopy,” Rev. Sci. Instrum. 70, 4–10 (1999).
  11. G. T. Maker and A. I. Ferguson, “Efficient frequency doubling of a mode-locked diode-laser-pumped Nd:YAG laser,” Appl. Phys. Lett. 55, 1158–1160 (1989).
  12. V. P. Yanovsky and F. W. Wise, “Frequency doubling of 100-fs pulses with 50% efficiency by use of a resonant enhancement cavity,” Opt. Lett. 19, 1952–1954 (1994).
  13. R. J. Jones and J. Ye, “Femtosecond pulse amplification by coherent addition in a passive optical cavity,” Opt. Lett. 27, 1848–1850 (2002).
  14. G. A. Marcus and H. A. Schwettman, “Cavity ringdown spectroscopy of thin films in the mid-infrared,” Appl. Opt. 41, 5167–5171 (2002).
  15. C. Montcalm, S. M. Lee, D. Burtner, A. Dummer, D. Siegfried, I. Wagner, and M. Watanabe, “High-rate dual ion beam sputtering deposition technology for optical telecommunication filters,” in Proceedings of the Forty-Fifth Annual Technical Conference of Society of Vacuum Coaters (Society of Vacuum Coaters, Albuquerque, N. Mex., 2002), pp. 245–249.
  16. C. K. Carniglia, “Scalar scattering theory for multiplayer optical coatings,” Opt. Eng. 18, 104–115 (1979).
  17. J. R. Taylor, An Introduction to Error Analysis (University Science, Sausalito, Calif., 1997).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited