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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 23 — Aug. 10, 2003
  • pp: 4649–4657

Optimal Intensity-Modulation Projection Technique for Three-Dimensional Shape Measurement

Cunwei Lu and Limin Xiang  »View Author Affiliations


Applied Optics, Vol. 42, Issue 23, pp. 4649-4657 (2003)
http://dx.doi.org/10.1364/AO.42.004649


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Abstract

A new pattern projection technique for measuring three-dimensional topography is presented, called the optimal intensity-modulation projection technique. The proposed technique dramatically shortens the measurement time and improves stripe detection accuracy compared with previous methods. Furthermore, the method deals reliably with discontinuous patterns and multiple objects.

© 2003 Optical Society of America

OCIS Codes
(100.6890) Image processing : Three-dimensional image processing
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

Citation
Cunwei Lu and Limin Xiang, "Optimal Intensity-Modulation Projection Technique for Three-Dimensional Shape Measurement," Appl. Opt. 42, 4649-4657 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-23-4649


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