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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 24 — Aug. 20, 2003
  • pp: 4955–4962

Transmitted and reflected scattering matrices from an English oak leaf

Sergey N. Savenkov, Ranjan S. Muttiah, and Yevgeny A. Oberemok  »View Author Affiliations


Applied Optics, Vol. 42, Issue 24, pp. 4955-4962 (2003)
http://dx.doi.org/10.1364/AO.42.004955


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Abstract

The complete Mueller matrix for an English oak (Quercus robur) leaf for a fixed azimuth angle (90°) was determined immediately after plucking and a day following exposure to normal room temperature and pressures. The Mueller matrices were determined for transmitted light at observation angles ranging from 0° to 24° and for reflected backscattering angles from 153° to 170°. All the measurements were taken with a He-Ne laser light source at 0.63 µm. Since positive eigenvalues were obtained for the coherence matrix, the polarimetric measurements were physically realizable. The anisotropy parameters were determined from the Jones matrices by use of the decomposition theorem. From the M33 and M44 components of the Mueller matrices, it was found that nonspherical structures within the leaf were primarily responsible for observed transmitted light scatter, and spherical structures were mostly responsible for observed backscatter. Variations in backscatter Mueller matrix elements from a fresh leaf to a second day of observation were assumed because of changes to water vapor concentration in the leaf.

© 2003 Optical Society of America

OCIS Codes
(030.6600) Coherence and statistical optics : Statistical optics
(260.2130) Physical optics : Ellipsometry and polarimetry
(260.5130) Physical optics : Photochemistry
(290.1350) Scattering : Backscattering
(290.4210) Scattering : Multiple scattering
(290.5850) Scattering : Scattering, particles

History
Original Manuscript: November 12, 2002
Revised Manuscript: May 7, 2003
Published: August 20, 2003

Citation
Sergey N. Savenkov, Ranjan S. Muttiah, and Yevgeny A. Oberemok, "Transmitted and reflected scattering matrices from an English oak leaf," Appl. Opt. 42, 4955-4962 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-24-4955


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