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Applied Optics

Applied Optics


  • Vol. 42, Iss. 24 — Aug. 20, 2003
  • pp: 4968–4974

Absorption line shift with temperature and pressure: impact on laser-diode-based H2O sensing at 1.393 µm

Richard Phelan, Michael Lynch, John F. Donegan, and Vincent Weldon  »View Author Affiliations

Applied Optics, Vol. 42, Issue 24, pp. 4968-4974 (2003)

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High-resolution absorption measurements of the H2O line in the v1 + v3 band at 1.3928 µm were made in the temperature range of 296–1100 K by use of an InGaAsP distributed-feedback laser diode operating at 1.39 µm. Spectral line shift, line strength, and N2 broadening on the water-vapor line and their impact on the accuracy of optical-absorption-based gas sensing have been investigated. The results obtained were compared with values obtained from the HITRAN database and values reported in the literature, facilitating H2O sensing in a nonstandard temperature and pressure environment.

© 2003 Optical Society of America

OCIS Codes
(140.3070) Lasers and laser optics : Infrared and far-infrared lasers
(280.1740) Remote sensing and sensors : Combustion diagnostics
(300.1030) Spectroscopy : Absorption
(300.6260) Spectroscopy : Spectroscopy, diode lasers
(300.6340) Spectroscopy : Spectroscopy, infrared

Original Manuscript: December 5, 2002
Revised Manuscript: May 19, 2003
Published: August 20, 2003

Richard Phelan, Michael Lynch, John F. Donegan, and Vincent Weldon, "Absorption line shift with temperature and pressure: impact on laser-diode-based H2O sensing at 1.393 µm," Appl. Opt. 42, 4968-4974 (2003)

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