Absorption Line Shift with Temperature and Pressure: Impact on Laser-Diode-Based H2O Sensing at 1.393 µm
Applied Optics, Vol. 42, Issue 24, pp. 4968-4974 (2003)
http://dx.doi.org/10.1364/AO.42.004968
Acrobat PDF (217 KB)
Abstract
High-resolution absorption measurements of the H2O line in the v1 + v3 band at 1.3928 μm were made in the temperature range of 296–1100 K by use of an InGaAsP distributed-feedback laser diode operating at 1.39 μm. Spectral line shift, line strength, and N2 broadening on the water-vapor line and their impact on the accuracy of optical-absorption-based gas sensing have been investigated. The results obtained were compared with values obtained from the HITRAN database and values reported in the literature, facilitating H2O sensing in a nonstandard temperature and pressure environment.
© 2003 Optical Society of America
[Optical Society of America ]
OCIS Codes
(140.3070) Lasers and laser optics : Infrared and far-infrared lasers
(280.1740) Remote sensing and sensors : Combustion diagnostics
(300.1030) Spectroscopy : Absorption
(300.6260) Spectroscopy : Spectroscopy, diode lasers
(300.6340) Spectroscopy : Spectroscopy, infrared
Citation
Richard Phelan, Michael Lynch, John F. Donegan, and Vincent Weldon, "Absorption Line Shift with Temperature and Pressure: Impact on Laser-Diode-Based H2O Sensing at 1.393 µm," Appl. Opt. 42, 4968-4974 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-24-4968
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