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Applied Optics

Applied Optics


  • Vol. 42, Iss. 25 — Sep. 1, 2003
  • pp: 5046–5053

Phase-shifting schlieren: high-resolution quantitative schlieren that uses the phase-shifting technique principle

Luc Joannes, Frank Dubois, and Jean-Claude Legros  »View Author Affiliations

Applied Optics, Vol. 42, Issue 25, pp. 5046-5053 (2003)

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A quantitative autocalibrated high-resolution schlieren technique for quantitative measurement of reflective surface shape is proposed. It combines the schlieren principle with the phase-shifting technique that is generally used in interferometry. With an appropriate schlieren filter and appropriately tailored setup, some schlieren fringes are generated. After application of the phase-shift technique, the schlieren phase is calculated and converted into beam deviation values. Theoretical and experimental demonstrations are given. The technique is validated on a reference target, and then its application in a fluid physics experiment is demonstrated. These two examples show the potential of the phase-shifting schlieren technique that in some situations can become competitive with interferometry but with a much better dynamic range and with variable sensitivity. The technique can also be used to measure refractive-index gradients in transparent media.

© 2003 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments

Original Manuscript: February 15, 2003
Revised Manuscript: May 22, 2003
Published: September 1, 2003

Luc Joannes, Frank Dubois, and Jean-Claude Legros, "Phase-shifting schlieren: high-resolution quantitative schlieren that uses the phase-shifting technique principle," Appl. Opt. 42, 5046-5053 (2003)

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