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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 25 — Sep. 1, 2003
  • pp: 5046–5053

Phase-shifting schlieren: high-resolution quantitative schlieren that uses the phase-shifting technique principle

Luc Joannes, Frank Dubois, and Jean-Claude Legros  »View Author Affiliations


Applied Optics, Vol. 42, Issue 25, pp. 5046-5053 (2003)
http://dx.doi.org/10.1364/AO.42.005046


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Abstract

A quantitative autocalibrated high-resolution schlieren technique for quantitative measurement of reflective surface shape is proposed. It combines the schlieren principle with the phase-shifting technique that is generally used in interferometry. With an appropriate schlieren filter and appropriately tailored setup, some schlieren fringes are generated. After application of the phase-shift technique, the schlieren phase is calculated and converted into beam deviation values. Theoretical and experimental demonstrations are given. The technique is validated on a reference target, and then its application in a fluid physics experiment is demonstrated. These two examples show the potential of the phase-shifting schlieren technique that in some situations can become competitive with interferometry but with a much better dynamic range and with variable sensitivity. The technique can also be used to measure refractive-index gradients in transparent media.

© 2003 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments

History
Original Manuscript: February 15, 2003
Revised Manuscript: May 22, 2003
Published: September 1, 2003

Citation
Luc Joannes, Frank Dubois, and Jean-Claude Legros, "Phase-shifting schlieren: high-resolution quantitative schlieren that uses the phase-shifting technique principle," Appl. Opt. 42, 5046-5053 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-25-5046


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References

  1. G. S. Settles, Schlieren and Shadowgraph Techniques—Visualizing Phenomena in Transparent Media (Springer-Verlag, Berlin, 2001). [CrossRef]
  2. H. Schardin, “Toepler’s schlieren method: basic principles for its use and quantitative evaluation,” in Selected Papers on Schlieren Optics, J. R. Meyer-Arendt, ed., Vol. MS 61 of SPIE Milestone Series (SPIE Press, Bellingham, Wash., 1992), pp. 32–55 (translation of “Das Toeplersche Schlierenverfahren: Grundlagen fur seine Anwendung und quantitative Auswertung,” Forschungsheft 367, Beilage zu Forschung auf dem Gebiete des Ingenieurwesens 1934; translation No. 156 by F. A. Raven for Navy Dept., David Taylor Model Basin, Washington, D.C., 1947).
  3. S. Settles, “Colour-coding Schlieren technique for the optical study of heat and fluid flow,” Int. J. Heat Fluid Flow 6, 3–15 (1985). [CrossRef]
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  5. P. Hariharan, B. F. Oreb, T. Eiju, “Digital phase-shifting interferometry: a simple error-compensation phase calculation algorithm,” Appl. Opt. 26, 2504–2506 (1987). [CrossRef] [PubMed]
  6. P. Colinet, J. C. Legros, M. G. Velarde, Nonlinear Dynamics of Surface-Tension-Driven Instabilities (Wiley-VCH, Berlin, 2001). [CrossRef]

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