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Applied Optics

Applied Optics


  • Vol. 42, Iss. 25 — Sep. 1, 2003
  • pp: 5140–5148

Effects of interface roughness on the spectral properties of thin films and multilayers

Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparré  »View Author Affiliations

Applied Optics, Vol. 42, Issue 25, pp. 5140-5148 (2003)

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We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated.

© 2003 Optical Society of America

OCIS Codes
(290.5880) Scattering : Scattering, rough surfaces
(310.0310) Thin films : Thin films

Original Manuscript: June 16, 2003
Published: September 1, 2003

Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparré, "Effects of interface roughness on the spectral properties of thin films and multilayers," Appl. Opt. 42, 5140-5148 (2003)

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