We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated.
© 2003 Optical Society of America
Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparre', "Effects of Interface Roughness on the Spectral Properties of Thin Films and Multilayers," Appl. Opt. 42, 5140-5148 (2003)