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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 25 — Sep. 1, 2003
  • pp: 5140–5148

Effects of interface roughness on the spectral properties of thin films and multilayers

Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparré  »View Author Affiliations


Applied Optics, Vol. 42, Issue 25, pp. 5140-5148 (2003)
http://dx.doi.org/10.1364/AO.42.005140


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Abstract

We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated.

© 2003 Optical Society of America

OCIS Codes
(290.5880) Scattering : Scattering, rough surfaces
(310.0310) Thin films : Thin films

History
Original Manuscript: June 16, 2003
Published: September 1, 2003

Citation
Alexander V. Tikhonravov, Michael K. Trubetskov, Andrei A. Tikhonravov, and Angela Duparré, "Effects of interface roughness on the spectral properties of thin films and multilayers," Appl. Opt. 42, 5140-5148 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-25-5140


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References

  1. A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov, A. Duparré, “Impact of surface roughness on spectral properties of thin films and multilayers,” in Optical Interference Coatings, Vol. 63 of 2001 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 2001), pp. ThB5-1–ThB5-3.
  2. J. M. Bennett, L. Mattsson, Introduction to Surface Roughness and Scattering, 2nd ed. (Optical Society of America, Washington, D.C., 1999).
  3. H. E. Bennett, J. O. Porteus, “Relation between surface roughness and specular reflectance at normal incidence,” J. Opt. Soc. Am. 51, 123–129 (1961). [CrossRef]
  4. P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, London, 1963).
  5. J. M. Elson, H. E. Bennett, J. M. Bennett, “Scattering from optical surfaces,” in Applied Optics and Optical Engineering, R. R. Shannon, J. C. Wyant, eds., (Academic, New York, 1979), Vol. VII, pp. 191–244. [CrossRef]
  6. C. K. Carniglia, “Scalar scattering theory for multilayer optical coatings,” Opt. Eng. 18, 104–115 (1979). [CrossRef]
  7. A. N. Bogolubov, A. A. Tikhonravov, “Effect of varying-scale roughness on the reflectivity from a boundary between two media,” Vestnik MSU Physics and Astronomy series, 3, 27–30 (2002) (in Russian).
  8. C. K. Carniglia, D. G. Jensen, “Single-layer model for surface roughness,” Appl. Opt. 41, 3167–3171 (2002). [CrossRef] [PubMed]
  9. F. Abelès, “Recherches sur la propagation des ondes electromagnetique sinusoidales dans les milieux stratifiés,” Ann. Phys. 5, 596–640, 706–782 (1950).
  10. S. Furman, A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Edition Frontieres, Gif-sur-Yvette, France, 1992).
  11. J. Ferre-Borrull, A. Duparré, E. Quesnel, “Procedure to characterize microroughness of optical thin films: application to ion-beam-sputtered vacuum-ultraviolet coatings,” Appl. Opt. 40, 2190–2199 (2001). [CrossRef]
  12. A. Duparré, J. Ferre-Borrull, S. Gliech, G. Notni, J. Steinert, J. M. Bennett, “Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171 (2002). [CrossRef] [PubMed]
  13. D. E. Aspnes, J. B. Theeten, F. Hottier, “Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry,” Phys. Rev. B 20, 3292–3302 (1979). [CrossRef]
  14. D. J. Bergman, “Exactly solvable microscopic geometries and rigorous bounds for the complex dielectric constant of a two-component composite material,” Phys. Rev. Lett. 44, 1285–1287 (1980). [CrossRef]
  15. G. W. Milton, “Bounds on the complex dielectric constant of a composite material,” Appl. Phys. Lett. 37, 300–302 (1980). [CrossRef]

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