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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 26 — Sep. 10, 2003
  • pp: 5302–5307

Quantization Error of CCD Cameras and Their Influence on Phase Calculation in Fringe Pattern Analysis

Oleksandr A. Skydan, Francis Lilley, Michael J. Lalor, and David R. Burton  »View Author Affiliations


Applied Optics, Vol. 42, Issue 26, pp. 5302-5307 (2003)
http://dx.doi.org/10.1364/AO.42.005302


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Abstract

We present an investigation into the phase errors that occur in fringe pattern analysis that are caused by quantization effects. When acquisition devices with a limited value of camera bit depth are used, there are a limited number of quantization levels available to record the signal. This may adversely affect the recorded signal and adds a potential source of instrumental error to the measurement system. Quantization effects also determine the accuracy that may be achieved by acquisition devices in a measurement system. We used the Fourier fringe analysis measurement technique. However, the principles can be applied equally well for other phase measuring techniques to yield a phase error distribution that is caused by the camera bit depth.

© 2003 Optical Society of America

OCIS Codes
(040.1490) Detectors : Cameras
(040.1520) Detectors : CCD, charge-coupled device
(100.2000) Image processing : Digital image processing
(100.2650) Image processing : Fringe analysis
(100.2960) Image processing : Image analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Citation
Oleksandr A. Skydan, Francis Lilley, Michael J. Lalor, and David R. Burton, "Quantization Error of CCD Cameras and Their Influence on Phase Calculation in Fringe Pattern Analysis," Appl. Opt. 42, 5302-5307 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-26-5302


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