OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 42, Iss. 28 — Oct. 1, 2003
  • pp: 5634–5641

Sensitivity Errors in Interferometric Deformation Metrology

David I. Farrant and Jon N. Petzing  »View Author Affiliations

Applied Optics, Vol. 42, Issue 28, pp. 5634-5641 (2003)

View Full Text Article

Acrobat PDF (177 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Interferometric measurement techniques such as holographic interferometry and electronic speckle-pattern interferometry are valuable for measuring the deformation of objects. Conventional theoretical models of deformation measurement assume collimated illumination and telecentric imaging, which are usually only practical for small objects. Large objects often require divergent illumination, for which the models are valid only when the object is planar, and then only in the paraxial region. We present an analysis and discussion of the three-dimensional systematic sensitivity errors for both in-plane and out-of-plane interferometer configurations, where it is shown that the errors can be significant. A dimensionless approach is adopted to make the analysis generic and hence scalable to a system of any size.

© 2003 Optical Society of America

OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

David I. Farrant and Jon N. Petzing, "Sensitivity Errors in Interferometric Deformation Metrology," Appl. Opt. 42, 5634-5641 (2003)

Sort:  Author  |  Year  |  Journal  |  Reset


  1. Y. Surrel, “Phase stepping: a new self-calibrating algorithm,” Appl. Opt. 32, 3598–3600 (1993).
  2. K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts,” J. Opt. Soc. Am. 14, 918–930 (1997).
  3. P. Picart, J. C. Pascal, and J. M. Breteau, “Systematic errors of phase-shifting speckle interferometry,” Appl. Opt. 40, 2107–2116 (2001).
  4. M. Kujawinska and J. Wojciak, “High accuracy Fourier transform fringe pattern analysis,” Opt. Lasers Eng. 14, 325–339 (1991).
  5. J. H. Massig and J. Heppner, “Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests,” Appl. Opt. 40, 2081–2088 (2001).
  6. A. Fernandez, G. H. Kaufmann, A. F. Doval, J. Blanco-Garcia, and J. L. Fernandez, “Comparison of carrier removal methods in the analysis of TV holography fringes by the Fourier transform method,” Opt. Eng. 37, 2899–2905 (1998).
  7. T. Takatsuji, B. F. Oreb, D. I. Farrant, and J. R. Tyrer, “Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method,” Appl. Opt. 36, 1438–1445 (1997).
  8. B. Kemper, D. Dirksen, J. Kandulla, and G. von Bally, “Quantitative determination of out-of-plane displacements by endoscopic electronic-speckle-pattern interferometry,” Opt. Commun. 194, 75–82 (2001).
  9. D. I. Farrant, J. N. Petzing, and J. R. Tyrer, “Geometrically qualified ESPI vibration analysis,” Opt. Lasers Eng., to be published.
  10. C. Joenathan, “Speckle photography, shearography, and ESPI,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech, Boston, Mass., 1997).
  11. W. Osten, “Application of optical shape measurement for the nondestructive evaluation of complex objects,” Opt. Eng. 39, 232–243 (2000).
  12. Ch. De Veuster, P. Slangen, Y. Renotte, L. Berwart, and Y. Lion, “Influence of the geometry of illumination and viewing beams on displacement measurement errors in interferometric metrology,” Opt. Commun. 143, 95–101 (1997).
  13. D. Albrecht, “Estimation of the 2d measurement error introduced by in-plane and out-of-plane electronic speckle pattern interferometry instruments,” Opt. Lasers Eng. 31, 63–81 (1999).
  14. W. S. W. Abdullah, J. N. Petzing, and J. R. Tyrer, “Wavefront divergence: a source of error in quantified speckle shearing data,” J. Mod. Opt. 48, 757–772 (2001).
  15. S. Schedin, G. Pedrini, H. J. Tiziani, and F. Mendoza Santoyo, “Simultaneous three-dimensional dynamic deformation measurements with pulsed digital holography,” Appl. Opt. 38, 7056–7062 (1999).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited