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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 30 — Oct. 20, 2003
  • pp: 6006–6015

Application of Frustrated Total Internal Reflection Devices to Analytical Laser Spectroscopy

David C. S. Beddows, Ben C. Griffiths, Ota Samek, and Helmut H. Telle  »View Author Affiliations


Applied Optics, Vol. 42, Issue 30, pp. 6006-6015 (2003)
http://dx.doi.org/10.1364/AO.42.006006


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Abstract

Novel implementations of single-fiber laser-induced breakdown spectroscopy and laser-induced fluorescence spectroscopy systems that gated light switches based on frustrated total internal reflection are described. The switching devices are largely wavelength independent, with full temporal and spatial separation of laser and fluorescence light. Wavelength-independent beam separation or beam combination schemes can be implemented for coaxial optical setups, e.g., in single-fiber or telescopic experimental arrangements. Selected practical examples of schemes for qualitative and quantitative analytical spectroscopy are discussed.

© 2003 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(140.3440) Lasers and laser optics : Laser-induced breakdown
(230.1360) Optical devices : Beam splitters
(230.4110) Optical devices : Modulators
(300.6280) Spectroscopy : Spectroscopy, fluorescence and luminescence
(300.6360) Spectroscopy : Spectroscopy, laser

Citation
David C. S. Beddows, Ben C. Griffiths, Ota Samek, and Helmut H. Telle, "Application of Frustrated Total Internal Reflection Devices to Analytical Laser Spectroscopy," Appl. Opt. 42, 6006-6015 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-30-6006

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