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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 31 — Nov. 1, 2003
  • pp: 6398–6411

Determination of the optical properties of a two-layer tissue model by detecting photons migrating at progressively increasing depths

Yasser S. Fawzi, Abo-Bakr M. Youssef, Mohamed H. El-Batanony, and Yasser M. Kadah  »View Author Affiliations


Applied Optics, Vol. 42, Issue 31, pp. 6398-6411 (2003)
http://dx.doi.org/10.1364/AO.42.006398


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Abstract

We have investigated a method for solving the inverse problem of determining the optical properties of a two-layer turbid model. The method is based on deducing the optical properties (OPs) of the top layer from the absolute spatially resolved reflectance that results from photon migration within only the top layer by use of a multivariate calibration model. Then the OPs of the bottom layer are deduced from relative frequency-domain (FD) reflectance measurements by use of the two-layer FD diffusion model. The method was validated with Monte Carlo FD reflectance profiles and experimental measurements of two-layer phantoms. The results showed that the method is useful for two-layer models with interface depths of >5 mm; the OPs were estimated, within a relatively short time (<1 min), with a mean error of <10% for the Monte Carlo reflectance profiles and with errors of <25% for the phantom measurements.

© 2003 Optical Society of America

OCIS Codes
(170.3660) Medical optics and biotechnology : Light propagation in tissues
(170.4580) Medical optics and biotechnology : Optical diagnostics for medicine
(170.5280) Medical optics and biotechnology : Photon migration
(170.7050) Medical optics and biotechnology : Turbid media

History
Original Manuscript: October 4, 2002
Revised Manuscript: March 31, 2003
Published: November 1, 2003

Citation
Yasser S. Fawzi, Abo-Bakr M. Youssef, Mohamed H. El-Batanony, and Yasser M. Kadah, "Determination of the optical properties of a two-layer tissue model by detecting photons migrating at progressively increasing depths," Appl. Opt. 42, 6398-6411 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-31-6398


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