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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 33 — Nov. 20, 2003
  • pp: 6584–6594

Twin-rainbow metrology. I. Measurement of the thickness of a thin liquid film draining under gravity

Charles L. Adler, James A. Lock, Ian P. Rafferty, and Wayne Hickok  »View Author Affiliations


Applied Optics, Vol. 42, Issue 33, pp. 6584-6594 (2003)
http://dx.doi.org/10.1364/AO.42.006584


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Abstract

We describe twin-rainbow metrology, a new optical technique used to measure the thickness of thin films in a cylindrical geometry. We also present an application of the technique: measurement of the thickness of a Newtonian fluid draining under gravity. We compare these measurements with fluid mechanics models.

© 2003 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(290.3200) Scattering : Inverse scattering

History
Original Manuscript: January 24, 2003
Revised Manuscript: June 11, 2003
Published: November 20, 2003

Citation
Charles L. Adler, James A. Lock, Ian P. Rafferty, and Wayne Hickok, "Twin-rainbow metrology. I. Measurement of the thickness of a thin liquid film draining under gravity," Appl. Opt. 42, 6584-6594 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-33-6584


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