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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 34 — Dec. 1, 2003
  • pp: 6830–6837

Fourier Fringe Analysis with Improved Spatial Resolution

Roman Vander, Stephen G. Lipson, and Ilya Leizerson  »View Author Affiliations


Applied Optics, Vol. 42, Issue 34, pp. 6830-6837 (2003)
http://dx.doi.org/10.1364/AO.42.006830


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Abstract

The spatial resolution of the phase image derived from the interferogram by Fourier fringe analysis is limited by the necessity to isolate a first order in the Fourier plane. By use of the two complementary outputs of the interferometer, it is possible to eliminate the zero order and thus to improve the spatial resolution by a factor of approximately 2. The theory of this improvement is presented and confirmed experimentally.

© 2003 Optical Society of America

OCIS Codes
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(070.2590) Fourier optics and signal processing : ABCD transforms
(070.4560) Fourier optics and signal processing : Data processing by optical means
(100.2650) Image processing : Fringe analysis
(100.3010) Image processing : Image reconstruction techniques

Citation
Roman Vander, Stephen G. Lipson, and Ilya Leizerson, "Fourier Fringe Analysis with Improved Spatial Resolution," Appl. Opt. 42, 6830-6837 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-34-6830


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References

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