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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 34 — Dec. 1, 2003
  • pp: 6919–6928

Thin-film achromatic phase shifters for nulling interferometry: design approach

Frédéric Lemarquis and Pierre Riaud  »View Author Affiliations


Applied Optics, Vol. 42, Issue 34, pp. 6919-6928 (2003)
http://dx.doi.org/10.1364/AO.42.006919


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Abstract

Nulling interferometry in the thermal IR is the most promising technique for direct detection of Earth-like exoplanets. This technique requires a π phase shifter for the parent star of the planet to be completely extinguished by destructive interference. We investigate how thin films can be used to design π achromatic phase shifters. The design approach that we propose works on reflection and can be carried out by two steps, namely, the design of a mirror and an antireflection structure with no constraint on the phase properties of the thin film stacks. Phase-shift accuracy is derived analytically, and a numerical example illustrates this concept.

© 2003 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings
(350.1260) Other areas of optics : Astronomical optics
(350.1270) Other areas of optics : Astronomy and astrophysics

History
Original Manuscript: April 3, 2003
Revised Manuscript: July 24, 2003
Published: December 1, 2003

Citation
Frédéric Lemarquis and Pierre Riaud, "Thin-film achromatic phase shifters for nulling interferometry: design approach," Appl. Opt. 42, 6919-6928 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-34-6919

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