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Applied Optics

Applied Optics


  • Vol. 42, Iss. 34 — Dec. 1, 2003
  • pp: 6939–6944

Effect of tin diffusion on the optical behavior of float glass in the soft-x-ray region

Mohammed H. Modi, Gyanendra S. Lodha, Kawal Jeet S. Sawhney, and Rajendra V. Nandedkar  »View Author Affiliations

Applied Optics, Vol. 42, Issue 34, pp. 6939-6944 (2003)

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The optical responses of two sides of float glass in the soft-x-ray region were studied at the Indus-1 synchrotron facility. To the best of our knowledge these are the first experimentally obtained optical data for both sides of float glass in the soft-x-ray region. Optical constants δ and β were determined by use of angle-dependent reflectance techniques in the wavelength range 80–200 Å. On the side of the glass that was tin indiffused, a significant difference in δ value from that of the non-tin-side surface was observed. The measured data were compared with Henke’s tabulated value of SiO2. The surface roughness of float glass was separately determined by hard-x-ray reflectivity to minimize the number of fitting variables. The effect of a contamination layer on the determination of optical constants was avoided by an appropriate sample-cleaning method.

© 2003 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(230.4170) Optical devices : Multilayers
(240.6700) Optics at surfaces : Surfaces
(340.7470) X-ray optics : X-ray mirrors

Original Manuscript: June 18, 2003
Revised Manuscript: September 2, 2003
Published: December 1, 2003

Mohammed H. Modi, Gyanendra S. Lodha, Kawal Jeet S. Sawhney, and Rajendra V. Nandedkar, "Effect of tin diffusion on the optical behavior of float glass in the soft-x-ray region," Appl. Opt. 42, 6939-6944 (2003)

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  1. Z. Yin, L. Berman, S. Dierker, E. Defresne, D. P. Siddons, “A simple x-ray focusing mirror using float glass,” in Optics for High Brightness Synchrotron Radiation Beamlines II, L. E. Berman, J. Arthur, eds., Proc. SPIE2856, 307–313 (1996). [CrossRef]
  2. E. Filatova, V. Lukyanov, R. Barchewitz, J. M. Andre, M. Idir, Ph. Stemmler, “Optical constants of amorphous SiO2 from photons in the range of 60–3000 eV,” J. Phys. Condens. Matter 11, 3355–3370 (1999). [CrossRef]
  3. E. O. Filatova, A. I. Stepanov, V. A. Luk’yanov, “Dispersion of optical constants of amorphous SiO2 in the energy region between 50 and 900 eV,” Opt. Spectrosc. 81, 416–420 (1996).
  4. H. R. Phillipp, “Silicon dioxide (SiO2) (glass),” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, Orlando, Fla., 1998), pp. 749–763.
  5. P. Tripathi, G. S. Lodha, M. H. Modi, A. K. Sinha, K. J. S. Sawhney, R. V. Nandedkar, “Optical constants of silicon and silicon dioxide using soft x-ray reflectance measurements,” Opt. Commun. 211, 215–223 (2002). [CrossRef]
  6. B. Sae-lao, R. Soufli, “Measurements of the refractive index of yttrium in the 50–1300-eV energy region,” Appl. Opt. 41, 7309–7316 (2002). [CrossRef] [PubMed]
  7. M. Huppauff, B. Lengeler, “Surface analysis of float glass by means of x-ray absorption, reflection, and fluorescence analysis,” J. Appl. Phys. 75, 785–791 (1994). [CrossRef]
  8. P. J. LaPuma, R. L. Snyder, S. Zdzieszynski, R. Bruckner, “Characterization of the tin diffusion into float glass using glancing angle x-ray characterization,” Adv. X-Ray Anal. 38, 705–709 (1995). [CrossRef]
  9. Y. Hayashi, K. Matsumoto, M. Kudo, “The diffusion mechanism of tin into glass governed by redox reactions during the float process,” J. Non-Cryst. Solids 282, 188–196 (2001). [CrossRef]
  10. Y. Hayashi, R. Akiyama, M. Kudo, “Surface characterization of float glass related to changes in the optical properties after reheating,” Surf. Interface Anal. 31, 87–92 (2001). [CrossRef]
  11. P. D. Townsend, N. Can, P. J. Chandler, B. W. Farmery, R. Lopez-Heredero, A. Peto, L. Salvin, D. Underdown, B. Yang, “Comparison of tin depth profile analyses in float glass,” J. Non-Cryst. Solids 223, 73–85 (1998). [CrossRef]
  12. I. Diel, J. Friedrich, C. Kunz, S. Di Fonzo, B. R. Müller, W. Jark, “Optical constants of float glass, nickel, and carbon from soft x-ray reflectivity measurements,” Appl. Opt. 36, 6376–6382 (1997). [CrossRef]
  13. R. V. Nandedkar, K. J. S. Sawhney, G. S. Lodha, A. Verma, V. K. Raghuvanshi, A. K. Sinha, M. H. Modi, M. Nayak, “First results on the reflectometry beamline on Indus-1,” Curr. Sci. 82, 298–304 (2002).
  14. E. M. Gullikson, R. Korde, L. R. Canfield, R. E. Vest, “Stable silicon photodiodes for absolute intensity measurements in the VUV and soft x-ray regions,” J. Electron. Spectrosc. Relat. Phenom. 80, 313–316 (1996). [CrossRef]
  15. G. S. Lodha, S. Pandita, A. Gupta, R. V. Nandedkar, K. Yamashita, “Thermal induced structural modification in Pt/C x-ray multilayer mirrors fabricated by electron beam evaporation,” Appl. Phys. A 62, 29–32 (1996). [CrossRef]
  16. R. M. Richardson, R. M. Dalgliesh, T. Brennan, M. R. Lovell, A. C. Barnes, “A neutron reflection study of the effect of water on the surface of float glass,” J. Non-Cryst. Solids 292, 93–107 (2001). [CrossRef]
  17. R. Soufli, E. H. Gullikson, “Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet soft-x-ray region,” Appl. Opt. 36, 5499–5507 (1997). [CrossRef] [PubMed]
  18. M. Born, E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).
  19. D. L. Windt, W. C. Cash, M. Scott, P. Arendt, B. Newnam, R. F. Fisher, A. B. Swatzlander, P. Z. Takacs, J. M. Pinneo, “Optical constants for thin films of C, diamond, Al, Si, and CVD SiC from 24 Å to 1216 Å,” Appl. Opt. 27, 279–295 (1988). [CrossRef] [PubMed]
  20. B. L. Henke, E. M. Gullikson, J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50–30,000 eV, Z = 1–92,” At. Data Nucl. Data Tables 54, 181–343 (1993). [CrossRef]
  21. E. Spiller, Soft X-Ray Optics (SPIE, Bellingham, Wash., 1994). [CrossRef]
  22. J. M. Grimal, P. Chartier, P. Lehuédé, “X-ray reflectivity: a new tool for the study of glass surfaces,” J. Non-Cryst. Solids 196, 128–133 (1996). [CrossRef]

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