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Applied Optics

Applied Optics


  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 627–633

Controlled modification and direct characterization of multimode-fiber refractive-index profiles

Brant C. Gibson, Shane T. Huntington, John D. Love, Tom G. Ryan, Laurence W. Cahill, and Darrell M. Elton  »View Author Affiliations

Applied Optics, Vol. 42, Issue 4, pp. 627-633 (2003)

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A combination of controlled annealing and characterization by scanning probe microscopy (SPM) is used to demonstrate that the refractive-index profile of a commercially available silica-based optical fiber can be accurately reconfigured for use as an evanescent field sensor. The process relies on the controlled relocation of the silica glass dopants across the fiber cross section through heat treatment and the accurate measurement of the resulting dopant redistribution with SPM and differential etching techniques. The effect of variable annealing along a length of fiber is to produce a mode transformer to couple light from a laser source into the sensing region of the fiber.

© 2003 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(180.5810) Microscopy : Scanning microscopy
(290.1990) Scattering : Diffusion
(290.3030) Scattering : Index measurements

Original Manuscript: July 24, 2002
Published: February 1, 2003

Brant C. Gibson, Shane T. Huntington, John D. Love, Tom G. Ryan, Laurence W. Cahill, and Darrell M. Elton, "Controlled modification and direct characterization of multimode-fiber refractive-index profiles," Appl. Opt. 42, 627-633 (2003)

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  1. K. Iga, Y. Kokubun, M. Oikawa, “Measurement of index distributions,” in Fundamentals of Microoptics: Distributed-Index, Microlens and Stacked Planar Optics (Academic, Orlando, Fla., 1984), pp. 139–176.
  2. K. I. White, “Practical application of the refracted near-field technique for the measurement of optical fiber refractive index profiles,” Opt. Quantum Electron. 11, 185–196 (1979). [CrossRef]
  3. K. W. Raine, J. G. N. Baines, D. E. Putland, “Refractive index profiling—state of the art,” J. Lightwave Technol. 7, 1162–1169 (1989). [CrossRef]
  4. L. McCaughan, E. E. Bergmann, “Index distributions of optical waveguides from their mode profile,” J. Lightwave Technol. LT-1, 241–244 (1983). [CrossRef]
  5. C. Saekeang, P. J. Chu, “Nondestructive determination of refractive index profile of an optical fiber: backward light scattering method,” Appl. Opt. 18, 1110–1116 (1979). [CrossRef] [PubMed]
  6. H. M. Presby, D. Marcuse, H. M. Astle, “Automatic refractive-index profiling of optical fibers,” Appl. Opt. 17, 2209–2214 (1978). [CrossRef] [PubMed]
  7. M. E. Marhic, P. S. Ho, M. Epstein, “Nondestructive refractive index profile measurement of clad optical fibers,” Appl. Phys. Lett. 26, 574–575 (1975). [CrossRef]
  8. K. Tatekura, “Determination of the index profile of optical fibers from transverse interferograms using Fourier theory,” Appl. Opt. 22, 460–463 (1983). [CrossRef] [PubMed]
  9. Q. Zhong, D. Inniss, “Characterization of the lightguiding structure of optical fibers by atomic force microscopy,” J. Lightwave Technol. 12, 1517–1523 (1994). [CrossRef]
  10. S. T. Huntington, P. Mulvaney, A. Roberts, K. A. Nugent, M. Bazylenko, “Atomic force microscopy for the determination of refractive index profiles of optical fibres and waveguides: a quantitative study,” J. Appl. Phys. 82, 2730–2734 (1997). [CrossRef]
  11. J. Canning, K. Sommer, M. England, S. Huntington, “Direct evidence of two types of UV-induced glass changes in silicate-based optical fibres,” Adv. Mater. 13, 970–973 (2001). [CrossRef]
  12. S. T. Huntington, S. Ashby, J. D. Love, M. Elias, “Direct measurement of core profile diffusion and ellipticity in fused taper couplers using atomic force microscopy,” Electron. Lett. 36, 121–122 (2000). [CrossRef]

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