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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 640–648

High-Speed Path-Length Scanning with a Multiple-Pass Cavity Delay Line

Pei-Lin Hsiung, Xingde Li, Christian Chudoba, Ingmar Hartl, Tony H. Ko, and James G. Fujimoto  »View Author Affiliations


Applied Optics, Vol. 42, Issue 4, pp. 640-648 (2003)
http://dx.doi.org/10.1364/AO.42.000640


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Abstract

Techniques for high-speed delay scanning are important for low-coherence interferometry, optical coherence tomography, pump probe measurements, and other applications. We demonstrate a novel scanning delay line using a multiple-pass cavity. Differential delays are accumulated with each pass so that millimeter delays can be generated with tens of micrometer mirror displacements. With special design criteria, misalignment sensitivity can be dramatically reduced. The system is demonstrated to scan 6 m/s at 2-kHz repetition rates. Real-time optical coherence tomography imaging with 500 pixel images at four frames/s is performed. Using a Cr:forsterite laser source, we obtained axial image resolutions of 6 μm with 92-dB sensitivity.

© 2003 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5800) Instrumentation, measurement, and metrology : Scanners
(170.4500) Medical optics and biotechnology : Optical coherence tomography

Citation
Pei-Lin Hsiung, Xingde Li, Christian Chudoba, Ingmar Hartl, Tony H. Ko, and James G. Fujimoto, "High-Speed Path-Length Scanning with a Multiple-Pass Cavity Delay Line," Appl. Opt. 42, 640-648 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-4-640


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