OSA's Digital Library

Applied Optics

Applied Optics


  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 674–681

Optical and structural properties of Ag-Si3N4 nanocermets prepared by means of ion-beam sputtering in alternate and codeposition modes

Sophie Camelio, David Babonneau, Thierry Girardeau, Johann Toudert, Florence Lignou, Marie-Françoise Denanot, Nicolas Maître, Angel Barranco, and Philippe Guérin  »View Author Affiliations

Applied Optics, Vol. 42, Issue 4, pp. 674-681 (2003)

View Full Text Article

Enhanced HTML    Acrobat PDF (845 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Ion-beam sputtering deposition has been used in two ways, as granular multilayers and as cosputtered film, to elaborate Ag-Si3N4 nanocermets. Multilayer deposition creates slightly oblate clusters, and cosputtering produces two cluster families: elongated clusters within the Si3N4 matrix and larger ones at the film surface. The transmittance spectra of these nanocermets are characterized by a surface plasmon resonance. In the reported research the position of this resonance is related to the morphological properties of silver nanoclusters, which are studied by transmission-electron microscopy, grazing-incidence small-angle x-ray scattering, and atomic-force microscopy.

© 2003 Optical Society of America

OCIS Codes
(160.4760) Materials : Optical properties
(240.6680) Optics at surfaces : Surface plasmons
(260.3910) Physical optics : Metal optics
(260.5740) Physical optics : Resonance
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: July 11, 2002
Revised Manuscript: October 2, 2002
Published: February 1, 2003

Sophie Camelio, David Babonneau, Thierry Girardeau, Johann Toudert, Florence Lignou, Marie-Françoise Denanot, Nicolas Maître, Angel Barranco, and Philippe Guérin, "Optical and structural properties of Ag-Si3N4 nanocermets prepared by means of ion-beam sputtering in alternate and codeposition modes," Appl. Opt. 42, 674-681 (2003)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. U. Kreibig, M. Vollmer, Optical Properties of Metal Clusters (Springer-Verlag, Berlin, 1995). [CrossRef]
  2. B. Palpant, B. Prével, J. Lermé, E. Cottancin, M. Pellarin, M. Treilleux, A. Perez, J. L. Vialle, M. Broyer, “Optical properties of gold clusters in the size range 2–4 nm,” Phys. Rev. B 57, 1963–1970 (1998). [CrossRef]
  3. A. Dakka, J. Lafait, M. Abd-Lefdil, C. Sella, M. Maaza, “Optical study of Ag-TiO2 nanocermet thin films prepared by RF sputtering,” Eur. Phys. J. Appl. Phys. 9, 105–114 (2000). [CrossRef]
  4. R. Joerger, R. Gampp, A. Heinzel, W. Graf, M. Khöl, P. Ganttenbein, “Optical properties of inhomogeneous media,” Sol. Energy Mater. Sol. Cells 54, 351–361 (1998). [CrossRef]
  5. M. J. Bloemer, J. W. Haus, “Broadband waveguide polarizers based on the anisotropic optical constants of nanocomposite films,” J. Lightwave Technol. 14, 1534–1540 (1996). [CrossRef]
  6. C. Flytzanis, F. Hache, M. C. Kelin, D. Ricard, P. H. Rossignal, “Nonlinear optics in composite materials,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1991), Vol. XXIX, pp. 323–411.
  7. E. M. Vogel, M. J. Weber, D. M. Krol, “Nonlinear optical phenomena in glass,” Phys. Chem. Glasses 32, 231–254 (1991).
  8. S. Debrus, J. Lafait, M. May, N. Pinçon, D. Prot, C. Sella, J. Venturini, “Z-scan determination of the third-order optical nonlinearity of gold:silica nanocomposites,” J. Appl. Phys. 88, 4469–4475 (2000). [CrossRef]
  9. Y. Hamanaka, A. Nakamura, S. Omi, N. Del Fatti, F. Vallée, C. Flytzanis, “Ultrafast response of nonlinear refractive index of silver nanocrystals embedded in glass,” Appl. Phys. Lett. 75, 1712–1714 (1999). [CrossRef]
  10. C. N. Afonso, J. Solis, R. Serna, J. Gonzalo, J. M. Ballesteros, J. C. G. De Sande, “Pulsed laser deposition of nanocomposite thin films for photonic applications,” in Laser Applications in Microelectronic and Optoelectronic Manufacturing IV, J. J. Dubowski, H. Helvajian, E. W. Kreutz, K. Sugioka, eds., Proc SPIE3618, 453–464 (1999). [CrossRef]
  11. M. F. Lambrinos, R. Valizadet, J. S. Colligon, “Effects of bombardment on optical properties during deposition of silicon nitride by reactive ion-beam sputtering,” Appl. Opt. 35, 3620–3626 (1996). [CrossRef] [PubMed]
  12. J. C. G. de Sande, R. Serna, J. Gonzalo, N. Afonso, D. E. Hole, A. Naudon, “Refractive index of Ag nanocrystal composite films in the neighborhood of the surface plasmon resonance,” J. Appl. Phys. 91, 1536–1541 (2002). [CrossRef]
  13. C. G. Granqvist, O. Hunderi, “Optical properties of Ag-SiO2 Cermet films: a comparison of effective-medium theories,” Phys. Rev. B 18, 2897–2906 (1978). [CrossRef]
  14. G. Battaglin, E. Cattaruzza, F. Gonella, G. Mattei, P. Mazoldi, C. Sada, X. Zhang, “Formation of metal alloy nanoclusters in silica by ion implantation and annealing in selected atmosphere,” Nucl. Instrum. Methods B 167–167, 857–863 (2000). [CrossRef]
  15. A. Sawaguchi, K. Toda, K. Niihara, “Mechanical and electrical properties of silicon nitride-silicon carbide nanocomposite material,” J. Am. Ceram. Soc. 74, 1142–1144 (1991). [CrossRef]
  16. J. R. Levine, J. B. Cohen, Y. W. Chung, P. Georgopoulos, “Grazing-incidence small-angle x-ray scattering: new tool for studying thin film growth,” J. Appl. Crystallogr. 22, 528–532 (1989). [CrossRef]
  17. A. Naudon, D. Thiaudière, “Grazing-incidence small-angle scattering. Morphology of deposited clusters and nanostructure of thin films,” J. Appl. Crystallogr. 30, 822–827 (1997). [CrossRef]
  18. M. Schmidbauer, Th. Wiebach, H. Raidt, M. Hanke, R. Kölher, H. Wawra, “Ordering of self-assembled Si1-xGex islands studied by grazing incidence small-angle x-ray scattering and atomic force microscopy,” Phys. Rev. B 58, 10,523–10,531 (1998). [CrossRef]
  19. D. Babonneau, I. R. Videnovic, M. G. Garnier, P. Oelhafen, “Morphology and size distribution of gold nanoclusters in a-C:H films studied by grazing incidence small-angle x-ray scattering,” Phys. Rev. B 63, 195401–195415 (2001). [CrossRef]
  20. B. Kutsch, O. Lyon, M. Schmitt, M. Mennig, H. Schmitd, “Small-angle x-ray scattering experiments in grazing incidence on sol-gel coatings containing nano-scaled gold colloids: a new technique for investigating thin coatings and films,” J. Appl. Crystallogr. 30, 948–956 (1997). [CrossRef]
  21. A. Guinier, G. Fournet, Small-Angle Scattering of X-Rays (Wiley, New York, 1955).
  22. V. Ilolý, T. Baumbach, “Nonspecular x-ray reflection from rough multilayers,” Phys. Rev. B 49, 10668–10676 (1994) [CrossRef]
  23. D. E. Aspnes, “The accurate determination of optical properties by ellipsometry,” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, Orlando, Fla., 1985), Chap. 5, p. 88.
  24. D. A. G. Bruggemann, “Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen,” Ann. Phys. (Leipzig) 5, 636–664 (1935).
  25. J. C. Maxwell-Garnett, “Colours in metal glasses and in metallic films,” Philos. Trans. R. Soc. London 203, 385–420 (1904). [CrossRef]
  26. C. F. Bohren, D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1983), pp. 141–148.
  27. E. D. Palik, ed, Handbook of Optical Constants of Solids (Academic, Orlando, Fla., 1985), p. 175.
  28. D. Babonneau, A. Naudon, D. Thiaudière, S. Lequien, “Morphological characterization of ion-sputtered C-Ag, C/C-Ag and Ag/C films by GISAXS,” J. Appl. Crystallogr. 32, 226–233 (1999). [CrossRef]
  29. T. Girardeau, S. Camelio, A. Traverse, F. Lignou, J. Allain, A. Naudon, Ph. Guérin, “Relation between the optical properties of composite Si3N4 thin films with embedded Cu clusters and the clusters’ morphology: irradiation effects,” J. Appl. Phys. 90, 1788–1794 (2001). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited