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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 691–700

Comparison of test images obtained from various configurations of scanning near-field optical microscopes

Claudine Bainier, Christophe Vannier, Daniel Courjon, Jean-Claude Rivoal, Sébastien Ducourtieux, Yannick De Wilde, Lionel Aigouy, Florian Formanek, Laurent Belliard, Pierre Siry, and Bernard Perrin  »View Author Affiliations


Applied Optics, Vol. 42, Issue 4, pp. 691-700 (2003)
http://dx.doi.org/10.1364/AO.42.000691


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Abstract

The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test object.

© 2003 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(180.5810) Microscopy : Scanning microscopy
(220.4840) Optical design and fabrication : Testing
(350.3950) Other areas of optics : Micro-optics

History
Original Manuscript: April 4, 2002
Revised Manuscript: October 3, 2002
Published: February 1, 2003

Citation
Claudine Bainier, Christophe Vannier, Daniel Courjon, Jean-Claude Rivoal, Sébastien Ducourtieux, Yannick De Wilde, Lionel Aigouy, Florian Formanek, Laurent Belliard, Pierre Siry, and Bernard Perrin, "Comparison of test images obtained from various configurations of scanning near-field optical microscopes," Appl. Opt. 42, 691-700 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-4-691

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