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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 701–707

Synthetic aperture interferometry: in-process measurement of aspheric optics

Richard Tomlinson, Jeremy M. Coupland, and Jon Petzing  »View Author Affiliations


Applied Optics, Vol. 42, Issue 4, pp. 701-707 (2003)
http://dx.doi.org/10.1364/AO.42.000701


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Abstract

A scanning probe consisting of a source and receive fiber pair is used to measure the phase difference between wave fronts scattered from the front and rear surfaces of an aspheric optic. This system can be thought of as a classical interferometer with an aperture synthesized from the data collected along the path of the probe. If the form of either surface is known, the other can be deduced. In contrast with classical interferometers, the method does not need test or null plates and has the potential to be integrated into the manufacturing process.

© 2003 Optical Society of America

OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(220.3630) Optical design and fabrication : Lenses
(220.4840) Optical design and fabrication : Testing
(220.5450) Optical design and fabrication : Polishing

History
Original Manuscript: May 31, 2002
Revised Manuscript: October 14, 2002
Published: February 1, 2003

Citation
Richard Tomlinson, Jeremy M. Coupland, and Jon Petzing, "Synthetic aperture interferometry: in-process measurement of aspheric optics," Appl. Opt. 42, 701-707 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-4-701

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