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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 42, Iss. 4 — Feb. 1, 2003
  • pp: 701–707

Synthetic Aperture Interferometry: In-Process Measurement of Aspheric Optics

Richard Tomlinson, Jeremy M. Coupland, and Jon Petzing  »View Author Affiliations


Applied Optics, Vol. 42, Issue 4, pp. 701-707 (2003)
http://dx.doi.org/10.1364/AO.42.000701


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Abstract

A scanning probe consisting of a source and receive fiber pair is used to measure the phase difference between wave fronts scattered from the front and rear surfaces of an aspheric optic. This system can be thought of as a classical interferometer with an aperture synthesized from the data collected along the path of the probe. If the form of either surface is known, the other can be deduced. In contrast with classical interferometers, the method does not need test or null plates and has the potential to be integrated into the manufacturing process.

© 2003 Optical Society of America

OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(220.3630) Optical design and fabrication : Lenses
(220.4840) Optical design and fabrication : Testing
(220.5450) Optical design and fabrication : Polishing

Citation
Richard Tomlinson, Jeremy M. Coupland, and Jon Petzing, "Synthetic Aperture Interferometry: In-Process Measurement of Aspheric Optics," Appl. Opt. 42, 701-707 (2003)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-42-4-701


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References

  1. E. Heynacher, “Aspheric optics. How they are made and why they are needed,” Phys. Technol. 10 (3), 124–131 (1979).
  2. D. M. G. Stevens, “The application of optical techniques in aspheric surface assessment,” Int. J. Mach. Tools Manufact. 32 (1), 19–25 (1992).
  3. G. Doughty and J. Smith, “Microcomputer-controlled polishing machine for very smooth and deep aspherical surfaces,” Appl. Opt. 26, 2421–2426 (1987).
  4. R. O. Maschmeyer, C. A. Andrrysick, T. W. Geyer, H. E. Meissner, C. J. Parker, and L. M. Sanford, “Precision molded-glass optics,” Appl. Opt. 22, 2410–2412 (1983).
  5. D. G. Burns, “Null test for hyperbolic convex mirrors,” Appl. Opt. 22, 12–13 (1983).
  6. B. Dorband and H. J. Tiziani, “Testing aspheric surfaces with computer-generated holograms: analysis of adjustment and shape errors,” Appl. Opt. 24, 2604–2611 (1985).
  7. M. Melozzi, L. Pezzati, and A. Mazzoni, “Testing aspheric surfaces using multiple annular interferograms,” Opt. Eng. 32, 1073–1078 (1993).
  8. P. Hariharan, B. F. Oreb, and Z. Wanzhi, “Measurement of aspheric surfaces using a microcomputer controlled digital radial-shear interferometer,” Opt. Acta 31, 989–999 (1984).
  9. W. Quandou, Z. Zhongyu, and Z. Xuejun, “Novel profilometer with dual digital length gauge for large aspherics measurement,” in Advanced Optical Manufacturing and Testing Technology 2000, L. Yang, H. M. Pollicove, Q. Xi, and J. C. Wyant, eds., Proc. SPIE 4231, 39–46 (2000).
  10. T.-H. Tsai, K.-C. Fan, and J.-I. Mou, “A variable-resolution optical profile measurement system,” Meas. Sci. Technol. 13, 190–197 (2002).
  11. K. Ehrmann, A. Ho, and K. Schindhelm, “A 3D optical profilometer using a compact disc reading head,” Meas. Sci. Technol. 9, 1259–1265 (1998).
  12. T. Dawei, “In-process sensor for surface profile measurement applying a common-mode rejection technique,” Opt. Laser Technol. 27, 351–353 (1995).
  13. M. Born and E. Wolf, “Elements of the theory of interference and interferometers,” in Principles of Optics (Cambridge U. Press, Cambridge, UK, 1997), Chap. 7, pp. 256–367.
  14. J. P. Fitch, Synthetic Aperture Radar (Springer-Verlag, Berlin, 1987).
  15. C. Bradley and J. Jeswiet, “An optical surface texture sensor suitable for integration into a coordinate measuring machine,” Ann. CIRP 48, 459–462 (1999).
  16. D. C. Ghiglia and L. A. Romero, “Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods,” Appl. Opt. 11, 107–117 (1972).
  17. J. C. Lagarias, J. A. Reeds, M. H. Wright, and P. E. Wright, “Convergence properties of the Nelder-Mead simplex method in low dimensions,” SIAM (Soc. Ind. Appl. Math.) J. Optim. 9 (1), 112–147 (1998).
  18. C. C. Paige and M. A. Saunders, “LSQR: an algorithm for sparse linear equations and sparse least squares,” ACM (Assoc. Comput. Mach.) Trans. Math. Software 8, 43–71 (1982).

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